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A kind of sample preparation method of in-situ heating chip for transmission electron microscope of nanomaterials

A technology for heating chips and nanomaterials, which is applied in the field of sample preparation for in-situ heating chips in transmission electron microscopes, can solve the problems of low utilization rate of thin film area, high cost, difficulty in sample preparation for different samples comparison experiments, etc. the effect of the success rate

Active Publication Date: 2019-11-12
GUANGXI UNIV
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Problems solved by technology

[0005] The object of the present invention is to provide a sample preparation method of in-situ heating chip for transmission electron microscope of nanomaterials, thereby overcoming the existence of Si 3 N 4 The disadvantages of the low utilization rate of the film area, the inability to conduct comparison experiments on different samples on the same heating chip, and the difficulty and high cost of sample preparation

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  • A kind of sample preparation method of in-situ heating chip for transmission electron microscope of nanomaterials

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Embodiment Construction

[0014] The specific embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings, but it should be understood that the protection scope of the present invention is not limited by the specific embodiments.

[0015] Unless expressly stated otherwise, throughout the specification and claims, the term "comprise" or variations thereof such as "includes" or "includes" and the like will be understood to include the stated elements or constituents, and not Other elements or other components are not excluded.

[0016] figure 1 It shows a schematic structural view of a sample preparation method of a TEM in-situ heating chip of nanomaterials according to a preferred embodiment of the present invention. The sample preparation method of the TEM in-situ heating chip of nanomaterials includes the following steps:

[0017] (1) The liquid injection device is cleaned. The liquid injection device includes a syringe and a liquid suction nee...

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Abstract

The present invention discloses a sample preparation method of a nano-material transmission electron microscope in-situ heating chip, and the method comprises the following steps: (1) cleaning a liquid injection device; (2) connecting one end of a Peek tube with one end of a hollow glass needle tube; (3) fixing the hollow glass needle tube to a micromanipulator; (4) drawing a liquid sample with a syringe; (5) removing a liquid suction needle and connecting the other end of the Peek tube with the syringe; (6) putting an in-situ heating chip on an objective table of a microscope; (7) moving the hollow glass needle tube until the position of a tip needle corresponds to a Si3N4 film to be loaded; and (8) injecting, along the Peek tube, a nano material liquid into the hollow glass needle tube by the syringe, and dispersing the nano material liquid through the tip needle onto the Si3N4 film to be loaded. The method can accurately titrate a sample solution, simple preparation is sample, cost can be reduced, comparative experiments on one chip are facilitated, and the usage rate of the chip is improved.

Description

technical field [0001] The invention relates to the field of in-situ test sample preparation for transmission electron microscopy, in particular to a sample preparation method for in-situ heating chips for transmission electron microscopy of nanomaterials. Background technique [0002] The in-situ heating experiment of transmission electron microscopy based on MEMS chip can observe the dynamic physical and chemical processes of functional nanomaterials (including nanoparticles and powders) at the atomic scale, and is an important method for studying the changes in morphology, structure and performance during the preparation and use of nanomaterials. Effective means of reaction mechanism. Commercial TEM in situ heating chips generally consist of Si substrates, metal heating ring electrodes and Si 3 N 4 film composition. Si covering the hole in the metal ring electrode or between the ring electrodes 3 N 4 The pores of the film function to support nanomaterials, conduct he...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01N1/28
CPCG01N1/28
Inventor 王双宝刘赟沈培康田植群尹诗斌
Owner GUANGXI UNIV
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