X-luminoscope fusion sample preparation method
A fusion sample preparation and fluorometer technology, which is used in the preparation of instruments, scientific instruments, and samples for testing, etc., can solve the problems of increasing the complexity of the experiment, the success rate of sample preparation is not high, and the samples are easily damped, so as to improve the sample preparation. Efficiency, shortening sample preparation time, and improving the effect of sample preparation success rate
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Examples
Embodiment Construction
[0020] The embodiment of the present invention uses PE material as a flux, and the PE material has stable chemical properties and good moisture resistance at room temperature, so it is easy to store. This material has a low melting point, and the temperature only needs to be controlled at about 130°C when melting the sample. This material has a high softening point, so the sample can be solidified quickly after being melted and poured into the mold. This kind of material also has excellent anti-friction, anti-scratch, anti-fouling and anti-adhesion properties, so the prepared samples are not easy to be damaged or burst. The sample preparation temperature of the present invention is low, the used crucible is made of stainless steel, and the price of the flux used is also very low, and the cost is much lower than that of borate melting sample preparation.
[0021] The present invention provides a kind of X fluorescence instrument fusion sample preparation method, comprises the ...
PUM
Property | Measurement | Unit |
---|---|---|
diameter | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com