125 results about "Section sample" patented technology

In an identifying device for performing personal identification using biometrics information such as an iris, face, blood vessel pattern, auricle, fingerprint, palm print, hand print or the like, in order to surely discriminate a living body from a non-living body and to surely preclude illegal use by impersonation using a forged fingerprint or the like, a biometrics information input section samples/inputs biometrics information for verification as image information from a living body portion relatively moving with respect to this biometrics information input section, and living-body detection surfaces in a living-body detecting means is arranged in contact with or in the proximity to the living body portion being moved with respect to the biometrics information input section so as to input the biometrics information for verification.

The invention discloses a full-automatic scanning system and a method for a microscopic section. The system comprises an object stage, a lighting device, an object lens, a Z-axis controller, a scanning camera and a computing device, the scanning camera is provided with a rolling shutter exposure mode and a banded array or banded subarray reading mode, the scanning camera performs a continuous digital imaging scanning for a banded partial area of a section sample which moves at a constant speed along a shutter rolling direction of the scanning camera, under the rolling shutter exposure mode, the scanning camera can perform a parallel exposure for next frame of image before the exposure of a former frame of image is finished, and the computing device can splice each frame of image which is subjected to continuous exposure to form a complete digital section. By means of the technical scheme, the uniform motion speed of the section sample can be improved, simultaneously the motion blurring caused by sample motion during exposure of the scanning camera can be reduced, the image acquisition speed is improved, and the image acquired by the scanning camera is clear and stable.

An isochronous packet transfer method is provided which can reduce a transmit buffer size required for isochronous packet transfer, and which can give a constant delay to an isochronous packet even if transmission of a cycle start packet is delayed. An isochronous packet received from an input side bus is input to a delay section, and this isochronous packet is delayed in accordance with delay information and is transmitted to an output side bus. Input side and output side cycle identification information generating sections respectively output cycle identification information which changes at a timing at which a cycle start packet is sent to the input side bus and the output side bus. Input side and output side reference cycle identification information generating sections sample the input side and output side cycle identification information at predetermined timing and output input side and output side reference cycle identification information. A delay information generating section adds a fixed delay to a difference in the elapsed cycle number for each bus from the predetermined timing, based on input side and output side cycle identification information and input side and output side reference cycle identification information to generate delay information.

A jitter measurement circuit includes: a conversion section sampling one of a reference signal and a measurement target signal in response to the other of the signals, thereby obtaining a sampling data string; and a determination section measuring jitter of the measurement target signal on the basis of the sampling data string obtained by the conversion section. Since the reference signal is a stable signal having a predetermined cycle, the sampling data string as a measurement result depends on the measurement target signal. Therefore, it is possible to simply measure jitter level in accordance with irregularity of the measurement result and on the basis of relative measurement to expected value data.

The invention discloses a device and method for collecting and segmenting of hyperspectral images of unstainedpathological sections. A section sample platform is supported in the middle of a bracket, the hyperspectral images of the unstainedpathological sectionsare automatically collected and processed through a computer, and lesion area segmentation resultsare obtained. Based on spectral difference caused by pathological changes of tissues, a personal computeris adopted to synchronously control relevant modules, spectral sequence images of the unstainedhistopathological sectionsare collected and preprocessed, and corresponding three-dimensionalhyperspectral dataare produced after overlaying;based the data and the combination with a currentlypopularneural network classificationthought, a spectral classification algorithm is developed to perform identity partitioning of a lesion area, thereby acceleratingthe identification rate and efficiency of the histopathological section, avoidingmanual errors which maybe brought during staining, and reducingthe time required by section making;automatic judgment is performed by utilizing a machine algorithm, therebyreducingsubjectivity caused by manual judgment. Therefore,a good auxiliary function is provided for a pathology doctor to detect the pathological sections.

The invention discloses a method and a device for preparing tri-axial test samples including sandwich layers. The method includes the steps: (1) turning a trapezoidal-thread sample leading-screw to a zero scale position; (2) filling a soil sample A into an assembled sample preparation mould and compacting by impact; (3) turning the leading-screw; (4) loosening sample preparation mould fixing nuts; (5) turning an ejector rod to enable the sample ejector rod to move an expected sandwich layer thickness downwards; (6) loosening sample preparation device screw top nuts; and (7) turning the sample leading-screw so that a sample is pushed out. The device comprises a sample preparation device base, the trapezoidal-thread sample leading-screw, a leading-screw distance measurement device, a leading-screw drive wrench, sample preparation mould fixing screws, an upper universal sample preparation mould, a lower universal sample preparation mould, an upper inclined-section sample preparation mould and a lower inclined-section sample preparation mould. By the method and the device, mixed sample preparation with different materials can be carried out, the tri-axial samples including the sandwich layers in different inclination angles can be prepared, and the thickness of the sandwich layers and the spatial positions of the sandwich layers in the whole samples can be controlled.

Mass-spectrometry based methods of analyzing estrogens and other steroids from biological tissue sections samples are disclosed herein. Methods of detecting a disease state or condition or elevated risk of a disease state or condition in a mammal from tissue sections are also disclosed.

The invention relates to a multi-group section perturbation method for uncertainty analysis of reactor physics calculation. The multi-group section perturbation method comprises the following steps: (1), on the basis of ENDF/B, making a multi-group section database and a point-by-point section database at different temperatures by using a nuclear database section processing program NJOY, and making the point-by-point section database in a resonant reaction channel at a resonant energy section into an ultra-fine-group database according to the equal rib width; (2), perturbing the point-by-point section database in the energy section corresponding to a certain energy group in a certain reaction channel so as to obtain a perturbed point-by-point section database; (3), strictly transferring perturbation of the point-by-point section database into the multi-group section database by using a linear and nonlinear perturbation transferring method; and (4), reconstructing by adopting a reaction channel section self-consistency principle to obtain a perturbed multi-group section database. According to the invention, the section of a basic reaction channel can be finely sampled; approximate treatment in the multi-group section perturbation process can also be reduced; and thus, a precise multi-group section sample can be obtained.

The invention provides a quantitative determination method for the cross section porosity of a loose mineral. The method comprises the following steps: sampling the loose mineral so as to obtain a polished section sample containing the cross section of the loose mineral; performing multipoint image collection on the polished section sample; extracting pore regions of each image by using the difference and a corresponding relationship of pores under reflected light of a polarizing microscope and the gradation of each image of the mineral by adopting a lithofacies image analysis system; calculating the specific value of the pore region area in the total area of the whole image so as to obtain the porosity; drawing a cross section porosity changing curve by measuring the porosities of the images on multiple collection points in a straight line penetrating through a whole observation surface of the polished section sample, so as to reflect the cross section porosity condition of the loose mineral. The method can be used for fast and accurately measuring and reflecting the inner porosity changing conditions of a loose mineral sample, so that accurate and effective theory data can be provided for performing a subsequent metallurgy technology.

The invention relates to a method for quantitatively characterizing the grain size of a main phase structure of a complex phase material, and belongs to the technical field of metal material physicalproperty inspection. By means of sample preparation, a section sample having microscopic difference between the main phase structure and a second-phase structure is prepared; EBSD surface scanning iscarried out, the calibration rate of the main phase structure is higher than 90%, the calibration rate of the second phase is lower than 10%, or even no diffraction pattern exists; finally, EBSD surface scanning data analysis is carried out to remove false points, singular points and noise points in a scanning result, then the calibrated data points of a second phase are set as a zero solution through a small particle removing mode, or a lining degree range corresponding to the second phase in a diffraction contrast graph is set as a zero solution, the noise point removal process is repeated,and grains of the main phase structure are quantitatively analyzed. The method has the advantages that the microscopic morphology of the main phase grains of the complex phase material can be clearlyand visually displayed, and quantitative characterizing is conducted on the grain size.

The invention provides a preparation method of an LTCC (Low Temperature Co-fired Ceramic) section sample. According to the preparation method, a section sample preparation is finished by co-operation of a sample fixing stage, a test sample grinding and polishing stage and a test sample corrosion stage. In the sample fixing stage, a product to be subjected to preparation is put into a mould and poured by a prepared curing agent for curing; in the test sample grinding and polishing stage, a cured test sample is cut and a section is ground and polished to obtain a primary section sample; in the test sample corrosion stage, the surface of the polished section is corroded by a prepared corrosive solution to obtain a corroded section, and a final sample is obtained by cleaning and wiping the corroded section. The preparation method provided by the invention not only solves the problems in an ion beam cutting method with high cost and long period, but also solves the problem that the metal appearance of section extension by adopting a grinding and polishing method is damaged; the test cost is reduced when precision requirements on the section sample preparation are high; meanwhile, the complexity is not increased almost; the section definition of a product is improved; the defects of a production process can be exposed; the process quality of the product can be recovered. The preparation method provided by the invention has the advantages of simplicity and convenience in operation, low cost and very good application and popularization values in engineering.

The invention provides an XLPE (Cross Linked Polythylene) insulation aging estimation method based on different frequency and dielectric loss ratios. The method comprises the following steps: preparing inner, middle and outer section samples of a cable insulator; performing sample dielectric loss measurement under voltages of 50Hz and 0.1Hz under the same conditions; acquiring the dielectric loss ratio of each sample under 0.1Hz and 50Hz; on the basis of the dielectric loss ratios, calculating to obtain dielectric loss ratios of all insulation layers and the overall insulator; estimating the aging state of an alternating-current or direct-current cable XLPE insulator according to the sizes and change rules of dielectric loss ratios of all the layers and the size of a dielectric loss ratio of the overall insulator. According to the method, influence of non-uniform aging of different positions can be eliminated, so that the overall state of the simulator can be well reflected, and the aging degree of an alternating-current or direct-current cable XLPE insulator can be accurately estimated; the amount of samples required for test is less, and the requirements on voltage and capacity of a test instrument are low; the dielectric loss ratios under different frequencies are taken as character parameters, so that the influence of the test instrument on system errors and external environment is reduced; comparison with historical data is not needed, and engineering application is convenient.

The invention discloses an IOS system list view creating method and system, and relates to the ISO system list expansion technical field; the method comprises the following steps: S1, allowing a client end to obtain a preset section protocol and a cell protocol; S2, allowing the client end to create a section type realizing the section protocol and a cell type realizing the cell protocol according to a section sample and a cell sample needed to create a list view; S3, allowing the client end to obtain source data needed to create the list view from a server, and to create embodiments belongs to the section type and cell type; S4, using various call back methods in a data source mechanism to obtain list view creation information, and creating the list view; S5, using various call back methods in a delegate mechanism to obtain list view layout configuration information, and setting layout configuration information of a section view and a cell view in the list. The invention also discloses the IOS system list view creating system.

The invention relates to a method for preparing a section sample used for analyzing an evolution process of a cubic texture, belonging to the field of base bands of high-temperature superconductive coating conductors. The method comprises the following steps of: preparing 6-10 samples with ND-RD surfaces or/and samples with TD-RD surfaces by shearing cold-rolled alloy base bands with the total deformation amount of being more than 99% and the average thickness of 80-120 mum, stacking the samples together, fixing the samples through a fixture, keeping one surfaces reserved outside the fixture same in height and regular, after polishing and burnishing the surfaces through 200#, 400#, 600#, 800# and 1500# waterproof abrasive papers, mechanically polishing the surfaces by using carborundum polishing and burnishing paste, and inevitably carrying out ultrasonic cleaning for 5-10 min before carrying out polishing and burnishing through the next type abrasive paper; and taking out the samples, and cleaning the samples by using acetone, ethanol and water respectively.

The invention provides a preparation method of a TEM plane sample. The preparation method comprises the following steps: providing a wafer, wherein the wafer comprises a substrate and a semiconductor device layer; coating the semiconductor device layer with an organic matter film; cutting the wafer coated with the organic matter film to form a to-be-tested sample; forming a protection layer on the surface adjacent to the surface coated with the organic matter film; executing ionic thinning on the to-be-tested sample to form the TEM plane sample. In the preparation method of the TEM plane sample, provided by the invention, the organic matter film of a certain thickness covers the sample, thus a material of the protection layer is prevented from being splashed on the sample to influence the observation of the sample in a sample preparing process. Therefore, a clear TEM image of the plane sample can be obtained, thus the purpose of observing and analyzing the filling capability of the film by using the plane sample is realized, and the analysis limitation of a section sample in the prior art is made up.

The invention discloses a preparation method of an in-situ electrified transmission electron microscope section sample of heterojunction film; the preparation method comprises the steps of I, removing impurities on the surface of the heterojunction film sample; II, setting a layer of metal conductive film on the upper end face of the sample; III, attaching a copper sheet to the metal conductive film; IV, cutting the sample into a flaky sample; V, grinding to thin the flaky sample; VI, thinning the sample with an ionic thinner to obtain an arc recess; VII, transferring the sample to an in-situ test chip; VIII, using a focused ion beam instrument to weld a film layer interface and copper sheet, under electrical property test, of the sample respectively to an electrical property test electrode and power-on electrode of the in-situ test chip, and subjecting the copper sheet and metal conductive film to Pt layer welding; IX, cutting the sample to obtain a gap for breaking the metal conductive film. It is possible for the in-situ test chip to perform electrical property testing on the section sample of the heterojunction film, and operating is facilitated.

The invention discloses a day-ahead plan safety checking method considering power distribution nondeterminacy of new energy.The method comprises the steps that the checking date is determined, the distribution probability density function of the power generation power of wind power, photovoltaics and other new energy at the 96 time frame within the interval of 15 minutes of the day is acquired, power generation power sampling is carried out according to the distribution probability density function of the new energy at the 96 time frame, tide section samples are formed, the section of each sample is subjected to safety checking and analyzing, the tide section samples are collected to obtain a safety checking and analyzing result, and probability distribution of electric transmission line power transmission is obtained; the probability of heavy loading and threshold crossing of equipment at the 96 time frame is analyzed, and the operation dangerous points of a day-head plan of a power grid are given.By the adoption of the method, the influence of the nondeterminacy factors of the wind power and the photovoltaics can be considered, the operation risks of the transmission equipment are quantitatively analyzed according to the probability distribution characteristic of the power generation power of the wind power and the photovoltaics, the lean level of safety checking of the day-ahead plan is improved, and a foundation is laid for improving the operation safety and economical efficiency of the power grid.

The invention discloses a phase identification method for vanadium slag rich in various impurity elements. The phase identification method comprises the following steps: preparing a vanadium slag standard sample; preparing a vanadium slag inlaid sample; preparing a vanadium slag polished section sample; placing the vanadium slag polished section sample under a polarizing microscope, regulating the polarizing microscope to a reflected light mode, observing colors and crystal forms of all phases on the vanadium slag polished section sample under a reflected light, predetermining varieties of all the phases and primarily marking the vanadium slag polished section sample; preparing a vanadium slag bonding sample; preparing a vanadium slag slice sample; placing the vanadium slag slice sample under the polarizing microscope, regulating the polarizing microscope to an orthogonal polarizing mode, observing colors and crystal forms of all phases on the vanadium slag slice sample under an orthogonal polarized light, secondarily determining the varieties of all the phases and secondarily marking the vanadium slag slice sample; respectively placing the secondarily marked vanadium slag slice sample under a scanning electron microscope in a way that a primarily marked face and a secondarily marked face are downward, and dotting and analyzing all the marked phases by an energy disperse spectroscopy to obtain the content of the elements in all the phases and finally determine all the phases.

The invention discloses a method and device for acquiring the deposition layer section of a hydraulic test tank. The method comprises: after finishing a hydraulic deposition test, using a liquid nitrogen freezing method to freeze a section to be tested, and freezing the water and underwater deposit of the section to be tested into ice cubes together so as to solidify the sample, and then taking out the solidified section sample. The device for realizing the method is composed of a water tank, separation boards, an inner cooling pipe, an outer cooling pipe, a thermal insulation layer, and a liquid nitrogen bottle. Two separation boards are respectively disposed at the upstream and downstream of the sample section. The inner cooling pipe and the outer cooling pipe are respectively positioned inside and outside the water tank. Suspended at the mouth of the water tank, the inner cooling pipe is about 20-40mm from the sidewalls and the bottom deposition layer surface of the water tank, while the outer cooling pipe is close to the outer walls of the water tank. The method and device of the invention solves the difficult problems of accurate sampling and measuring in experimental research of the deposition, transfer and conversion rules of silt, organic matters, heavy metals and other pollutants in rivers, lakes and oceans, thus being suitable for research of multilayer deposits.

The invention discloses a gastric cancer identification method and device, and a storage medium. The method comprises the steps of acquiring a first preset number of gastric pathological section sample images, marking non-cancerous points, cancerous points and a cancerous shape curve formed by the cancerous points on each gastric pathological section sample image, cutting, and generating a cut image set; then, training a structure identification model by using sample images in the cut image set; and finally, receiving pathological section images waiting for gastric cancer identification, identifying the pathological section images by using a pre-trained structure identification model, and generating an identification result. According to the method, a new structural model is adopted for identifying the pathological section images, so as to determine whether a patient corresponding to the pathological section image suffers gastric cancer, thereby improving identification accuracy of gastric cancer.