5 results about "Section sample" patented technology

The invention discloses a preparation method and a test method of a thin film section nanoindentation test sample. The preparation method comprises the following steps: providing n cuboid samples, wherein the samples meet n * dgt; w, l: w = 1: 1-2: 1, d is the thickness of the sample, l is the length of the sample, and w is the width of the sample; the non-target crystal faces of the n samples are subjected to opposite bonding, the width of an opposite bonding seam is not larger than 1 micrometer, the target crystal faces of the n samples are located on the same side and spliced to form a test face, the test face comprises at least two different target crystal faces, and therefore the self-supporting opposite bonding sample is obtained, the test face of the opposite bonding sample is subjected to polishing treatment, and the self-supporting opposite bonding sample is obtained. And the surface roughness of the test surface is smaller than 5% of the preset indentation depth, so that the section sample is obtained. According to the invention, the test sample is prepared by adopting a sample opposite adhesion mode, so that a plurality of samples can provide a plurality of different sections to be tested, and the test efficiency is remarkably improved.

The application provides a TEM sample preparation method, comprising the following steps: step one: extracting a sample containing a first target position and a second target position from a chip surface; step two: bonding the sample to a first welding column of a copper carrier; step three: cutting the sample to separate the first target position and the second target position, and cutting off the first target position; step four: bonding the first target position cut off in step three to a second welding column of the copper carrier; step five: cutting the sample remaining on the first welding column to cut off the second target position, and bonding the sample cut off to a third welding column of the copper carrier; and step six: etching the first target position and the second target position respectively until a TEM analysis thickness is reached. The application can simultaneously prepare TEM samples of two target positions with a horizontal distance of less than 370 nm, and overcomes the defect that two close-range cross-section samples cannot be simultaneously prepared by a traditional method.

The invention provides a section sample fixing method based on low-melting-point alloy, which comprises the following steps: providing a sample table which comprises a bottom plate and a side plate, and the side plate is vertically arranged on the surface of the bottom plate; molten low-melting-point alloy is placed on the surface of the bottom plate and the surfaces of the side plates, and alloy liquid drops are formed; providing a section sample, and attaching the section sample to the alloy liquid drops on the surface of the bottom plate and the surface of the side plate, so that the to-be-observed surface of the section sample faces upwards; and cooling the sample table until the alloy liquid drops are solidified so as to fix the section sample. In the application, aiming at the special fixing requirement of the chip cross section sample, alloy liquid drops are formed on the bottom surface and the side surface of the cross section sample, so that the inclination of the sample is fundamentally eliminated physically by utilizing the liquid phase self-balance effect during solidification of the alloy liquid drops, and lossless and stress-free firm fixing can be realized.

The utility model discloses pathological section equipment with a paraffin sheet adhesion prevention function, and belongs to the technical field of medical instruments, the pathological section equipment is characterized by comprising a holding rod, a battery is arranged in the holding rod, and a control mainboard is arranged on the rear side in the holding rod. The slicing knife can be stably clamped by adjusting the heat conduction clamping plate, it is ensured that the slicing knife is always in the optimal state during working, meanwhile, the slicing knife can be evenly heated through the heat conduction clamping plate by means of the nickel-chromium alloy heating wire embedded in the outer side of the heat conduction clamping plate under regulation and control of the control main board, the surface temperature of the slicing knife is increased, and therefore the slicing knife can be continuously heated. During slicing, the viscosity of paraffin is effectively reduced, the adhesion of paraffin sheets on the surface of the slicing knife is greatly reduced, the continuity and integrity of slices are guaranteed, the quality of the slices is remarkably improved, and reliable slice samples are provided for subsequent pathological diagnosis.

This application relates to the field of materials testing technology and discloses a diaphragm cross-section sample and its preparation method. The present invention provides a diaphragm cross-section sample, comprising a first base layer and a first adhesive layer. Along the Z-direction, the thickness of the first base layer is H1, and the thickness of the diaphragm sample is H2, satisfying the following relationship: 0.9 ≥ H1 / H2 ≥ 1.5. By limiting the thickness relationship between the first base layer thickness H1 and the diaphragm sample thickness H2 to 0.9 ≥ H1 / H2 ≥ 1.5, the present invention enables the thickness of the first base layer to be close to the thickness of the diaphragm sample. The relatively thick first base layer, approximately equal in thickness to the diaphragm sample, provides physical support for the flexible and easily deformable diaphragm sample. Thus, after the diaphragm sample is laid on the first base layer through the first adhesive layer, the resulting composite material can rapidly harden at normal room temperature, shortening the overall hardening time, thereby simplifying the sample preparation process, shortening the sample preparation time, and improving experimental efficiency.