18 results about "Section sample" patented technology

The invention discloses a preparation method and a test method of a thin film section nanoindentation test sample. The preparation method comprises the following steps: providing n cuboid samples, wherein the samples meet n * dgt; w, l: w = 1: 1-2: 1, d is the thickness of the sample, l is the length of the sample, and w is the width of the sample; the non-target crystal faces of the n samples are subjected to opposite bonding, the width of an opposite bonding seam is not larger than 1 micrometer, the target crystal faces of the n samples are located on the same side and spliced to form a test face, the test face comprises at least two different target crystal faces, and therefore the self-supporting opposite bonding sample is obtained, the test face of the opposite bonding sample is subjected to polishing treatment, and the self-supporting opposite bonding sample is obtained. And the surface roughness of the test surface is smaller than 5% of the preset indentation depth, so that the section sample is obtained. According to the invention, the test sample is prepared by adopting a sample opposite adhesion mode, so that a plurality of samples can provide a plurality of different sections to be tested, and the test efficiency is remarkably improved.

The utility model provides a dangerous cross section sample cutting and clamping tool, relates to the technical field of sample clamping, and solves the technical problems that the existing dangerous cross section sample cutting, clamping and fixing are not stable, so that sample deviation is easily caused, and the machining size quality is influenced. The two groups of clamping pieces are used for clamping the two sides of a sample, the limiting pushing piece is used for fixing and pushing one end of the sample, and the limiting pushing piece is further provided with a horizontal fixing piece. A dangerous section sample is placed between the clamping pieces, namely the limiting pushing pieces, the two sides of the sample are fixed through the clamping pieces, one end of the sample is fixed through the limiting pushing pieces, and the sample is fixed through the horizontal fixing piece, so that the sample is prevented from deviating in the horizontal direction; a cutting edge is exposed from one end, far away from the limiting fixing piece, of the sample, and cutting sampling is facilitated.

The invention discloses a quantitative analysis method for exfoliation corrosion resistance of an aluminum alloy material, and belongs to the technical field of exfoliation corrosion resistance detection of aluminum alloy. The method comprises the following steps: (1) establishing a corresponding relation between a corrosion grade and a microscopic corrosion layer depth range; (2) uniformly dividing a to-be-tested surface of the aluminum alloy sample into a plurality of alternately distributed test surfaces and non-test surfaces, and coating the non-test surfaces with protective coatings; (3) preparing a corrosion solution according to alloy types and standard requirements, and carrying out a corrosion test; and (4) after the corrosion test is completed, cutting a section sample at the position where the surface exfoliation corrosion is most serious, measuring the depth of a corrosion layer, and determining the corrosion level by comparing the established corresponding relationship between the corrosion level and the depth range of the microscopic corrosion layer. According to the method, a numerical value corresponding relationship is established between the exfoliation corrosion level of the aluminum alloy and the actual exfoliation corrosion depth, and the exfoliation corrosion state of the surface of the aluminum alloy and the depth of a microscopic corrosion layer are associated, so that quantitative analysis of the exfoliation corrosion level is realized.

The invention discloses a preparation method of a section sample. The preparation method comprises the following steps: step 1, forming a first mark for coarse positioning; 2, measuring the relative distance between the first mark and the target structure on the chip sample; and step 3, forming a plurality of FIB marks for fine positioning according to the relative distance, wherein the FIB marks comprise a second mark, a third mark, a fourth mark and a fifth mark. The second mark and the third mark extend in the Y direction and are distributed on the two sides of the target structure in the X direction. The fourth mark extends in the X direction and is located at a first presentation distance on an upstream side in the Y direction of the target structure. The fifth mark comprises a flush structure flush with the X-direction extension section of the target structure, and a first straight line and a second straight line which are connected with the flush structure and located on the upstream side of the flush structure. And step 4, performing sample preparation and grinding, namely grinding until a fourth mark is observed. And grinding is continued until the flush structure of the fifth mark is observed. According to the invention, efficient fixed-point preparation and efficient fixed-point analysis of the section sample can be realized.

The present invention discloses a method for preparing a cross-sectional sample, comprising: step one, forming a first mark for coarse positioning. Step two, measuring the relative distance between the first mark and the target structure on the chip sample. Step three, forming a plurality of FIB marks for fine positioning according to the relative distance, the FIB marks comprising second to fifth marks. The second mark and the third mark extend along the Y direction and are distributed on both sides of the target structure along the X direction. The fourth mark extends along the X direction and is located at a first prompt distance on the upstream side of the target structure in the Y direction. The fifth mark comprises a flush structure flush with the X-direction extension section of the target structure and a first and second straight line connected to the flush structure and located on the upstream side of the flush structure. Step four, performing sample preparation grinding, comprising: grinding until the fourth mark is observed. Grinding is continued until the flush structure of the fifth mark is observed. The present invention can achieve efficient point-to-point preparation of cross-sectional samples and can achieve efficient point-to-point analysis.

The invention relates to a titanium alloy nitriding layer depth detection method, and belongs to the technical field of detection. The titanium alloy nitrided part is sectioned through linear cutting low-speed wire cutting, the section with the nitrided layer on the outer surface is exposed, and a section sample is obtained; mounting the section sample to obtain a to-be-ground sample after mounting; grinding and polishing the to-be-ground sample to obtain a to-be-eroded sample; preparing a first erosion reagent; preparing a second erosion reagent; cleaning the to-be-eroded sample with alcohol; wiping the surface of the to-be-eroded sample with a first eroding reagent; obtaining a first erosion sample; wiping the surface of the first erosion sample with a second erosion reagent; obtaining a second erosion sample; observing the erosion surface of the second erosion sample, and detecting the depth of a seepage layer; according to the method, the chemical solution is adopted to erode the polished titanium alloy nitriding surface, and different colors are displayed by utilizing different corrosion resistances of the nitriding layer and the base body, so that the nitriding layer and the base body layer are distinguished through the colors, and the depth of the nitriding layer can be accurately detected.

The present invention relates to a method for determining the mechanical properties of metal materials in a high-temperature tensile test, and in particular to a method for determining the elongation of a high-temperature tensile test specimen. The test specimen is placed in a solution, and each time it is lowered by the same distance d, mm; a relationship curve between the total volume V of the solution and the sample immersed therein and the sample lowering distance d is drawn, if point A corresponds to a sample lowering distance d1, mm, and point B corresponds to a sample lowering distance d2, mm, then L=d2-d1; the original length of the sample is measured to be l0, mm, and the length of the two sections of the sample connected to form a sample is l1, mm, then the deformation amount of high-temperature tensile ΔL mm is ΔL=l1-l0; the original length L0 of the actual deformed part of the sample is L0=L-ΔL; then the elongation λ, %, can be obtained according to the elongation calculation formula, which is #imgabs0# The present invention can effectively and accurately determine the elongation of a high-temperature tensile test specimen.

The invention provides a method for measuring the elasticity modulus of a non-uniform section sample by correcting a contact type extensometer, which comprises the following steps of: firstly, acquiring the stress, strain and deformation of the non-uniform section sample under the action of an external load in the measuring range of the extensometer; the variable cross section of the non-uniform-section sample is decomposed into a series of tiny sections, each section has a constant cross section area, the stress and strain of each tiny section are obtained, and the total strain of the non-uniform-section sample is obtained based on the obtained stress and strain of each tiny section; the total deformation amount of the sample is obtained based on the total strain of the non-uniform-section sample, and finally the elastic modulus of the sample is solved through the external force acting on the non-uniform-section sample and the total deformation amount of the non-uniform-section sample. The method is reasonable in conception, and can accurately measure the elastic modulus of the non-national standard part, thereby providing a powerful guarantee for the precision and the service life of the part in the use process.

The application provides a TEM sample preparation method, comprising the following steps: step one: extracting a sample containing a first target position and a second target position from a chip surface; step two: bonding the sample to a first welding column of a copper carrier; step three: cutting the sample to separate the first target position and the second target position, and cutting off the first target position; step four: bonding the first target position cut off in step three to a second welding column of the copper carrier; step five: cutting the sample remaining on the first welding column to cut off the second target position, and bonding the sample cut off to a third welding column of the copper carrier; and step six: etching the first target position and the second target position respectively until a TEM analysis thickness is reached. The application can simultaneously prepare TEM samples of two target positions with a horizontal distance of less than 370 nm, and overcomes the defect that two close-range cross-section samples cannot be simultaneously prepared by a traditional method.

The invention provides a section sample fixing method based on low-melting-point alloy, which comprises the following steps: providing a sample table which comprises a bottom plate and a side plate, and the side plate is vertically arranged on the surface of the bottom plate; molten low-melting-point alloy is placed on the surface of the bottom plate and the surfaces of the side plates, and alloy liquid drops are formed; providing a section sample, and attaching the section sample to the alloy liquid drops on the surface of the bottom plate and the surface of the side plate, so that the to-be-observed surface of the section sample faces upwards; and cooling the sample table until the alloy liquid drops are solidified so as to fix the section sample. In the application, aiming at the special fixing requirement of the chip cross section sample, alloy liquid drops are formed on the bottom surface and the side surface of the cross section sample, so that the inclination of the sample is fundamentally eliminated physically by utilizing the liquid phase self-balance effect during solidification of the alloy liquid drops, and lossless and stress-free firm fixing can be realized.

The application discloses a dual-purpose sample stage with an auxiliary positioning function, which comprises a base, the base is formed with a platform and a groove, the platform is suitable for carrying a planar sample, and the groove is suitable for placing a cross-section sample; wherein the platform is formed with multiple partitions, each partition is suitable for carrying a planar sample, and each partition is provided with a positioning indicating piece; at least one positioning assembly is arranged in the groove, the positioning assembly is suitable for fixing the cross-section sample, and the groove is also provided with a positioning indicating piece. The application can realize loading of the planar sample and the cross-section sample, and further realize synchronous observation or testing of the planar sample and the cross-section sample; meanwhile, the planar sample or the cross-section sample can be accurately positioned, which is helpful to keeping the repeatability and consistency of a sample observation point.

The invention relates to the technical field of material science and solid mechanics, and discloses a method and system for representing densification of an amorphous material under mechanical deformation, and the method comprises the following steps: applying a mechanical load to the amorphous material to initiate local plastic deformation of the amorphous material; milling the deformed region of the amorphous material by adopting a focused ion beam technology to prepare a cross-section sample, and then obtaining the microstructure change of the cross-section sample through a transmission electron microscope to confirm the densified region of the cross-section sample; the degree of densification of the cross-sectional sample is detected and quantified by analyzing an electron diffraction pattern. According to the embodiment of the invention, the key challenge of accurately quantifying the local structure change (the most significant is permanent volume compression (densification)) in the amorphous material under the action of various contact-induced mechanical loads is solved.

The utility model discloses pathological section equipment with a paraffin sheet adhesion prevention function, and belongs to the technical field of medical instruments, the pathological section equipment is characterized by comprising a holding rod, a battery is arranged in the holding rod, and a control mainboard is arranged on the rear side in the holding rod. The slicing knife can be stably clamped by adjusting the heat conduction clamping plate, it is ensured that the slicing knife is always in the optimal state during working, meanwhile, the slicing knife can be evenly heated through the heat conduction clamping plate by means of the nickel-chromium alloy heating wire embedded in the outer side of the heat conduction clamping plate under regulation and control of the control main board, the surface temperature of the slicing knife is increased, and therefore the slicing knife can be continuously heated. During slicing, the viscosity of paraffin is effectively reduced, the adhesion of paraffin sheets on the surface of the slicing knife is greatly reduced, the continuity and integrity of slices are guaranteed, the quality of the slices is remarkably improved, and reliable slice samples are provided for subsequent pathological diagnosis.

The invention discloses a sample brittle failure device. The device comprises a shell; the sample tank is arranged on the shell and is used for containing a sample; the impact part is connected with the shell and is positioned right above the opening of the sample groove; and the control part is connected with the shell, is positioned right above the impact part, and is used for controlling the impact part to be fixed or fall. Wherein the impact part comprises an elastic piece, the elastic piece is in a compressed state when the impact part is fixed, the elastic piece is in a released state when the impact part falls, and the elastic force direction of the elastic piece is parallel to the falling direction of the impact part. The elastic piece provides power for the impact piece under the action of self elasticity, and the impact strength of the impact piece can be accurately controlled by adjusting the compression state of the elastic piece, so that the brittle fracture section sample preparation stability is ensured, and the accuracy of a composite fiber material detection result is improved.

This application relates to the field of materials testing technology and discloses a diaphragm cross-section sample and its preparation method. The present invention provides a diaphragm cross-section sample, comprising a first base layer and a first adhesive layer. Along the Z-direction, the thickness of the first base layer is H1, and the thickness of the diaphragm sample is H2, satisfying the following relationship: 0.9 ≥ H1 / H2 ≥ 1.5. By limiting the thickness relationship between the first base layer thickness H1 and the diaphragm sample thickness H2 to 0.9 ≥ H1 / H2 ≥ 1.5, the present invention enables the thickness of the first base layer to be close to the thickness of the diaphragm sample. The relatively thick first base layer, approximately equal in thickness to the diaphragm sample, provides physical support for the flexible and easily deformable diaphragm sample. Thus, after the diaphragm sample is laid on the first base layer through the first adhesive layer, the resulting composite material can rapidly harden at normal room temperature, shortening the overall hardening time, thereby simplifying the sample preparation process, shortening the sample preparation time, and improving experimental efficiency.

The invention relates to a method for positioning an electromagnetic stirring influence area at the tail end of a continuous casting billet through in-situ detection, which comprises the following steps of: 1, selecting a cross section sample of the continuous casting billet as an initial sample, and determining an inner arc and an outer arc of the sample; step 2, determining the size of the detection surface and the sampling position on the initial sample according to the section specification of the casting blank, wherein the detection surface of the in-situ detection sample is rectangular; 3, cutting the initial sample along the rectangular contour to obtain an in-situ detection sample, and treating the sample according to the processing requirements of in-situ detection on the sample; 4, carrying out in-situ detection on the processed in-situ detection sample; and 5, reducing the segregation two-dimensional diagram of the in-situ detection sample to the initial sample, and positioning the electromagnetic stirring influence area at the tail end of the continuous casting billet according to the segregation two-dimensional diagram reduced to the initial sample. According to the method, the high-carbon steel casting blank sample is subjected to in-situ detection analysis, and the segregation two-dimensional diagram is interpreted and analyzed, so that the method is clear, accurate and rapid.

The utility model discloses a double-curvature part inspection frame, which relates to the technical field of airplane sheet metal parts, is used for inspecting double-curvature parts, and comprises a plurality of section sample plates with L-shaped sections, the plurality of section sample plates are arranged in parallel, and one ends of the plurality of section sample plates are detachably connected with the same first reinforcing structure; and the bottoms of the other ends of the plurality of section sample plates are detachably connected with the same second reinforcing structure. According to the utility model, the two first reinforcing plates and the two second reinforcing plates are detachably fixed at the two ends of the plurality of section sample plates, the inspection frame capable of inspecting the double-curvature part is formed through the combination mode, and the inspection frame is good in overall stability and high in appearance accuracy, meets the requirements of part manufacturing and inspection, and improves the production efficiency. And the part machining quality is improved.

The invention provides a steel section self-supervision anomaly detection method and system based on dynamic negative sample mining. The method comprises the following steps: S1, constructing a multi-branch network model; s2, performing edge saliency analysis on the non-abnormal sample graph of the steel section to intercept a saliency region, and obtaining a non-abnormal sample sub-graph and an edge saliency binary graph; s3, combining the random Berlin noise graph with the edge saliency binary image, generating a composite mask I according to a minimum intersection principle, and then obtaining an abnormal mask through abnormal region screening and smoothing processing; generating a synthetic abnormal picture by using the texture data, the abnormal mask and the non-abnormal sample sub-graph; and S4, carrying out multi-branch network model training by using the non-abnormal sample sub-graph and the synthetic abnormal sample, and obtaining a trained multi-branch network model to carry out steel section sample graph anomaly detection. The method is suitable for complex conditions that the number of samples is small, the number of defect categories is large and training is difficult, and has the advantages of easy training, high detection capability and excellent detail processing capability.