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Transmission electron microscope sample holder for three-dimensional reconstruction

A technology for TEM samples and three-dimensional reconstruction, which is applied in the field of sample rods and can solve problems such as inability to achieve rotation

Active Publication Date: 2018-06-15
ZHEJIANG UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

For a transmission electron microscope that is not equipped with a large-tilt goniometer, the rotation of the sample by plus or minus 70° cannot be achieved even if the large-tilt sample holder is purchased

Method used

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  • Transmission electron microscope sample holder for three-dimensional reconstruction

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Embodiment Construction

[0015] A transmission electron microscope sample rod used for three-dimensional reconstruction, the sample rod is connected with a sample holder 61, and a sample 62 is clamped on the sample holder 61; the sample rod includes a hollow casing 1 and a rotating shaft 2 installed in the casing 1, the rotating shaft A pair of bearings 3 are arranged between 2 and the housing 1, and a rotating drive mechanism for driving the rotation of the rotating shaft 2 is provided on the rotating shaft 2; the sample holder 61 is fixed to one end of the rotating shaft 2. The sample rod is set to be assembled by the shell 1 and the rotating shaft 2, and the rotating action is completed by the rotating shaft 2, and the rotating device is installed between the shaft and the rotating shaft 2, without changing the shape and size of the sample rod, so there is no need to change the electron microscope Structure. The outer ring of the bearing is fixed to the housing 1, the inner ring of the bearing is f...

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Abstract

The invention relates to a transmission electron microscope sample holder for three-dimensional reconstruction. The sample holder is connected with a sample clamp, a sample is clamped on the sample clamp, the sample holder comprises a hollow casing and a rotation shaft mounted in the casing, a pair of bearings are arranged between the rotation shaft and the casing, the rotation shaft is provided with a rotation driving mechanism used for driving the rotation shaft for rotation, and the sample clamp is fixed with one end of the rotation shaft. The transmission electron microscope sample holderis advantaged in that changing the structure of a transmission electron microscope in the prior art is not needed, and 360-DEG rotation of the sample can be realized.

Description

technical field [0001] The invention relates to a sample rod of a transmission electron microscope (TEM). Background technique [0002] Transmission electron microscopy is an important instrument that can observe the microstructure of materials at the sub-nanometer scale. In-depth observation and study of the microstructure of materials plays a vital role in the design of new high-performance materials and the construction of material structure and performance relationships. The main development direction of modern transmission microscopy technology is to develop transmission microscopy characterization technology and comprehensively analyze the morphology, structure, orientation, composition and other information of materials. In terms of material morphology characterization, in principle, if the sample can be rotated 360° when observing the sample, and the morphology of the sample at each viewing angle can be obtained, a three-dimensional model of the sample can be constru...

Claims

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Application Information

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IPC IPC(8): H01J37/20G01N23/04
CPCG01N23/04H01J37/20
Inventor 王宏涛张奕志刘嘉斌方攸同
Owner ZHEJIANG UNIV
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