Force and electrical behavior testing device under Nanometer lines in-situ compressing in transmission electron microscope
A technology of transmission electron microscope and testing device, which is applied in the fields of measuring device, strength characteristics, material analysis by electromagnetic means, etc. and other problems, to achieve the effect of reliable performance, easy operation and wide application range
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[0026] As shown in Figure 1, the piezoelectric ceramic sheet 2 is placed in the sealed tube 1 of the sample rod, and its inner end is fixed on the sealed tube 1 of the sample rod, and one end of the two driving wires 19 is connected to the piezoelectric ceramic sheet 2 positive and negative poles, and the other end is externally connected to the driving power supply 20. The connecting rod 5 is a rigid material, placed in the groove of the bearing base 4, one end of the connecting rod 5 is fixedly connected with the outer end of the piezoelectric ceramic sheet 2, and the other end of the connecting rod 5 is connected to the integrated block 6 by screws. The metal slider 13 is connected. The ends of the two loading wires 17 and the two signal wires 18 are connected to the gold-plated silicon chip 10 and the metal slider 13 on the integrated block 6 and are detachable. The other end of the driving wire 19, the loading wire 17 and the signal wire 18 are drawn from the outer end o...
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