Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Force and electrical behavior testing device under Nanometer lines in-situ compressing in transmission electron microscope

A technology of transmission electron microscope and testing device, which is applied in the fields of measuring device, strength characteristics, material analysis by electromagnetic means, etc. and other problems, to achieve the effect of reliable performance, easy operation and wide application range

Inactive Publication Date: 2008-01-30
BEIJING UNIV OF TECH
View PDF0 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Although this method can effectively give information on the atomic scale, it cannot quantify the elastic coefficient of a single one-dimensional nanomaterial
[0008] None of the above methods can measure the electrical properties of a single one-dimensional nanomaterial under stress, and can no longer meet the current requirements for testing the mechanical properties, electrical properties, and mechanical-electrical coupling performance of nanomaterials on the microscopic scale.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Force and electrical behavior testing device under Nanometer lines in-situ compressing in transmission electron microscope
  • Force and electrical behavior testing device under Nanometer lines in-situ compressing in transmission electron microscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] As shown in Figure 1, the piezoelectric ceramic sheet 2 is placed in the sealed tube 1 of the sample rod, and its inner end is fixed on the sealed tube 1 of the sample rod, and one end of the two driving wires 19 is connected to the piezoelectric ceramic sheet 2 positive and negative poles, and the other end is externally connected to the driving power supply 20. The connecting rod 5 is a rigid material, placed in the groove of the bearing base 4, one end of the connecting rod 5 is fixedly connected with the outer end of the piezoelectric ceramic sheet 2, and the other end of the connecting rod 5 is connected to the integrated block 6 by screws. The metal slider 13 is connected. The ends of the two loading wires 17 and the two signal wires 18 are connected to the gold-plated silicon chip 10 and the metal slider 13 on the integrated block 6 and are detachable. The other end of the driving wire 19, the loading wire 17 and the signal wire 18 are drawn from the outer end o...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention provides a test device of the mechanical and electrical properties of a nano-wire compressed in situ in a transmission electron microscope, which pertains to the field of nano-material property test in situ. The device employs a piezoceramic drawing unit, a micro-cantilever mechanical testing system and an electrical measuring system to achieve compression in situ of a single nano-wire or other one-dimensional nano-materials in the transmission electron microscope, and employs the imaging system of the transmission electron microscope to obtain deformation information on a nano or even atomic scale during the compression process. At the same time, the invention can achieve the quantitative measurements of such mechanical properties as elasticity, plasticity, bending and fracturing, and the electrical properties measurement of one-dimensional nano-materials to allow the study on the transport property of a charge during the compression process. The device of the invention has the advantages of simple structure, easy operation, a wide range of application, intuition and quantitative measurement and is beneficial to the explanation and discovery of the good comprehensive property of nano-materials in respect of mechanics, electricity, etc.

Description

Technical field: [0001] The invention relates to a device for testing electromechanical properties under in-situ compression of nanowires in a transmission electron microscope, which belongs to the field of in-situ detection of properties of nanometer materials. Background technique: [0002] Realizing the manipulation and in-situ performance measurement of monomeric nanostructures is a key scientific and technological issue that is the bottleneck in the research of new nanostructures, new properties and new devices, especially in the transmission electron microscope, due to its narrow space, people It is more difficult to realize the test of the single nanostructure. [0003] It should be pointed out that although people have conducted in-depth studies on the mechanical and electrical properties of monomeric nanomaterials in recent years, due to their difficulty and complexity, no accepted conclusions have been formed so far. One-dimensional nanomaterials are used as inter...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01N13/10G01N3/00G01N27/00G01Q60/10
Inventor 韩晓东郑坤张泽
Owner BEIJING UNIV OF TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products