Device and method for performing in-situ double-tilting single-axis stretching on nanowire and two-dimensional laminar thin film in transmission electron microscope

A technology of transmission electron microscopy and uniaxial stretching, which is applied in the direction of applying stable tension/pressure to test the strength of materials, can solve the problems of non-reusability, low utilization rate, high price, etc., saving time cost and price cost, Easy fixation and high sample size requirements

Inactive Publication Date: 2015-05-20
BEIJING UNIV OF TECH
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Problems solved by technology

The disadvantage of this device is that the utilization rate is low, it cannot be reuse

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  • Device and method for performing in-situ double-tilting single-axis stretching on nanowire and two-dimensional laminar thin film in transmission electron microscope
  • Device and method for performing in-situ double-tilting single-axis stretching on nanowire and two-dimensional laminar thin film in transmission electron microscope
  • Device and method for performing in-situ double-tilting single-axis stretching on nanowire and two-dimensional laminar thin film in transmission electron microscope

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Embodiment Construction

[0034] The present invention will be specifically described below in conjunction with the accompanying drawings, but the present invention is not limited to the following embodiments.

[0035] The in-situ double-tilt uniaxially stretched nanowire and two-dimensional layered thin film device in a transmission electron microscope is characterized in that it includes three parts: a supporting part, a driving part and a carrier network. The supporting part is a metal ring 1 with an outer diameter of 3mm and an inner diameter of 2mm, and the inner structure is horseshoe-shaped, and the "horseshoe platform" is used to fix one end of the thermal bimetal. The material of the metal ring is copper with good thermal conductivity, and the thickness is between 25 μm and 30 μm. The driving part is a thermal bimetal 2, and the material used is a non-magnetic metal with a large difference in thermal expansion coefficient (such as copper and titanium), the length of the free end is greater tha...

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Abstract

The invention relates to a device and a method for performing in-situ double-tilting single-axis stretching on a nanowire and a two-dimensional laminar thin film in a transmission electron microscope, belonging to the field of in-situ mechanical performance measurement research of transmission electron microscope accessories and a nanomaterial. The device comprises a supporting part, a power part and a carrying network part. The supporting part is a metal ring; the driving part is a thermal double-metal sheet, one end of the double-metal sheet is fixedly arranged on the metal ring, the other end of the double-metal sheet generates driving force through bending and moving caused by heat expansion; the carrying network can carry a nanomaterial and is adhered onto the free end of the double-metal sheet, the heated bent double-metal sheet stretches the carrying network, so that the stretching effect of the nanomaterial can be achieved. According to the device, the axial stretching of a single nanowire, and stretching of single-layer/multilayer two-dimensional thin films can be realized conveniently, the problems that the nanowire and the thin film in the original double-metal sheet technology are difficult to fix and poor in stability can be solved, and the structure evolution of the material during deformation can be observed.

Description

technical field [0001] The invention relates to a device and a stretching method for studying the mechanical properties of nanowires and two-dimensional layered films in a uniaxial stretching process at the atomic scale in situ in a transmission electron microscope. The invention belongs to the technical field of instruments and equipment for in-situ characterization of nanometer material microstructure. Background technique [0002] With the development of nano-devices and the development of micro-mechanical systems, the study of the mechanical properties of single nanowires and two-dimensional films under external forces is particularly important. Due to the small structure of nanomaterials, the transmission electron microscope (hereinafter referred to as TEM) has become an important tool for studying nanomaterials. However, the pole piece of the transmission electron microscope is very small, generally around a few millimeters. It is very difficult to fix and apply stres...

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Application Information

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IPC IPC(8): G01N3/08
Inventor 韩晓东卢艳王晓冬王立华臧科涛毛圣成张泽
Owner BEIJING UNIV OF TECH
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