Device for regulating and controlling temperature field of terahertz spectrograph
A spectrometer and temperature field technology, applied in the field of terahertz spectrometer testing, can solve the problems that cannot be put into a terahertz spectrometer system, cannot be tested, cannot be satisfied, etc., achieves simple temperature control principle, expands research field and application range, and low cost Effect
Inactive Publication Date: 2014-03-05
TSINGHUA UNIV
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Problems solved by technology
However, it cannot meet the requirements of THz time-domain spectroscopy for the following reasons: 1. The design of the dielectric window cannot meet the requirements of the transmission and reflection optical path of THz spectrum; 2. The horizontal structure cannot be tested in the horizontal optical path; 3. The volume is large ( Length × width × height = 250 × 150 × 35mm), cannot be put into the terahertz spectroscopy system
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[0029] Using the present invention, the terahertz transmission spectrum and emission spectrum of Ф10×2mm gadolinium ferrite (GdFeO3) ceramics are tested at -130~130°C, and the test results are as attached figure 2 shown. The results show that as the temperature decreases, the transition frequency blue-shifts, and the relationship between the frequency and temperature approximately follows a parabola.
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A device for regulating and controlling the temperature field of a terahertz spectrograph is provided. The device is composed of a sample chamber, a refrigeration module and a heating module; an embedded cabin body mechanism is adopted as the sample chamber; screwing caps with screw threads are arranged at the front and the back of the cabin body; medium-free hole windows are reserved at the centers of the screwing caps; a jack for a thermocouple is reserved at one side surface of the sample chamber; a liquid nitrogen inlet above the sample chamber is connected with a liquid nitrogen dewar flask; a liquid nitrogen outlet is connected with a liquid nitrogen self-priming pump; a heat-emitting body inside the heating module under the sample chamber is connected with a silicon controlled rectifier actuator; the thermocouple is connected with a temperature controller; the temperature controller is connected with the silicon controlled rectifier actuator; a sample is arranged in the sample chamber; being fixed through the screwing caps arranged at the front and the back of the sample chamber, the sample closely contacts with the inner surface of the cabin body; the flow rate of the liquid nitrogen self-priming pump is made to be constant, and the lowest temperature of the sample chamber can reach 195 DEG C below zero; the temperature controller and the silicon controlled rectifier actuator automatically control the power of the heat-emitting body, such that the sample chamber can achieve set temperature and set temperature rise rate; and a PT100 thermal resistor is mounted in the jack so as to feed back the temperature of the sample chamber.
Description
technical field [0001] The invention relates to the technical field of terahertz spectrometer testing, in particular to a device for regulating the temperature field of a terahertz spectrometer. Background technique [0002] Terahertz spectrum refers to electromagnetic waves with frequencies ranging from 0.1 to 10 THz. Before the 1980s, research in this field was almost blank, and it was called the "THz gap". In recent years, breakthroughs have been made in the generation and detection technology of THz waves. THz spectroscopy has been widely used in research fields such as material structure characterization, material electromagnetic response research, biomedical imaging, and safety detection. One of the most cutting-edge subject areas. [0003] Currently commercially available terahertz time-domain spectrometers can only study the spectral characteristics of materials in the THz band at room temperature. Due to the uncontrollability of the electromagnetic response and t...
Claims
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IPC IPC(8): G05D23/20
Inventor 席小庆傅晓建
Owner TSINGHUA UNIV
