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Inductance measurement method and measurement device

A technology of inductance measurement and inductance, which is applied in measurement devices, measurement of electrical variables, measurement of resistance/reactance/impedance, etc., can solve the problems of complex structure and high cost, and achieve the effect of simplified structure, fast and efficient processing, and convenient and fast measurement.

Active Publication Date: 2017-02-15
贵安新区仪源矽晶科技有限公司
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  • Application Information

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Problems solved by technology

In the prior art, specific measuring instruments are required to measure inductance, and these measuring instruments have relatively complex structures and high costs

Method used

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  • Inductance measurement method and measurement device
  • Inductance measurement method and measurement device
  • Inductance measurement method and measurement device

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Embodiment Construction

[0035] In order to express the present invention more clearly, the present invention will be further described below in conjunction with the accompanying drawings.

[0036] The main idea of ​​the inductance measurement method of the present invention is to use the inductive reactance measurement method. The circuit for the inductance measurement of the multimeter cannot be very complicated, so only simple circuits can be made. Therefore, the present invention uses the HY12P66 2 of Taiwan Hongkang Company as the measurement platform to realize the automatic or manual range measurement of the inductance of the multimeter.

[0037] HY12P66 2 is a special chip for multimeter. It has high performance, low power consumption, and analog / digital converter with microprocessor inside. Device, voltage boost circuit and stabilized power supply, high stability bandgap reference power supply, automatic range conversion and function control circuit, buzzer drive circuit, clock oscillation c...

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Abstract

The invention discloses an inductance measurement method and a measurement device. The measurement method comprises the following steps: S1, HY12P66 outputs equivalent-width square wave from a PT2.2 pin; S2, equivalent-width square wave is inputted from a PA6 pin and then outputted from a PA4 pin via a switching network and applied to a standard resistor and a measured inductor which are mutually connected in series, wherein voltage applied to the standard resistor is U1 and voltage applied to the measured inductor is U2; S3, U1 and U2 are transmitted to an MCU via a network switch, and true virtual value conversion is performed on U1 and U2 by the MCU; S4, the MCU controls the switching network according to numerical values after U1 and U2 conversion so that a measuring range is automatically converted; S5 proportion operation is performed on U1 and U2 converted into DC voltage at the MCU, and U1 and U2 are transmitted to a display driver via an A / D converter; and S6, the display driver drives a displayer to display a measurement result. The inductance measurement method is rapid and accurate.

Description

technical field [0001] The invention belongs to the field of electrical parameter measurement, in particular to an inductance measurement method and a measurement device. Background technique [0002] Inductance is a property of a closed loop. When the coil passes current, a magnetic field induction is formed in the coil, and the induced magnetic field will generate an induced current to resist the current passing through the coil. The interaction between the current and the coil is called electric Inductive reactance, that is, inductance. In the prior art, specific measuring instruments are required to measure inductance, and these measuring instruments have relatively complicated structures and high costs. [0003] Now, the measurement of current, voltage and resistance can all be done by the multimeter. Compared with the voltmeter, ammeter and resistance meter with a single common energy, integrating multiple functions into the multimeter can share components and save re...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R27/26
Inventor 李弋
Owner 贵安新区仪源矽晶科技有限公司
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