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Method and device for correcting phase errors of interference spectrum imaging instrument

A technology of interferometric imaging and phase error, applied in interferometric spectroscopy, spectrum investigation, etc., can solve problems affecting processing efficiency and achieve the effect of improving accuracy and taking into account calculation speed

Inactive Publication Date: 2015-01-28
ACAD OF OPTO ELECTRONICS CHINESE ACAD OF SCI
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Problems solved by technology

The Forman method has high calculation accuracy, but multiple convolution processing will affect the processing efficiency

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  • Method and device for correcting phase errors of interference spectrum imaging instrument
  • Method and device for correcting phase errors of interference spectrum imaging instrument
  • Method and device for correcting phase errors of interference spectrum imaging instrument

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Embodiment Construction

[0023] The technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without making creative efforts belong to the protection scope of the present invention.

[0024] Such as figure 1 As shown, an embodiment of the present invention provides a phase error correction method for an interference spectrum imager, including:

[0025] Step 11, carry out IFFT (Inverse Fast Fourier Transformation, inverse Fast Fourier Transformation) to the small bilateral part of the interferogram obtained by the interference spectrum imager to obtain a phase factor, and carry out FFT (Fast Fourier Transformation, Fast Fourier T...

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Abstract

The invention discloses a method and device for correcting phase errors of an interference spectrum imaging instrument. The method for correcting the phase errors of the interference spectrum imaging instrument includes the steps that IFFT is carried out on small bilateral portions of an interference pattern obtained by the interference spectrum imaging instrument to obtain phase factors, and FFT is carried out on the phase factors to obtain a symmetrization function; convolution processing is carried out on the interference pattern and the symmetrization function to obtain a convolution interference pattern; IFFT is carried out on the convolution interference pattern to obtain a recovery spectrum function, and IFFT is carried out on the small bilateral portions of the convolution interference pattern to obtain phase error factors; the recovery spectrum function is corrected through the phase error factors to obtain a target spectrum function. The interference pattern is firstly corrected in the time domain, then the spectrum function is corrected in the frequency domain, the accuracy of a recovery spectrum is improved, and meanwhile consideration is given to the calculation speed.

Description

technical field [0001] The invention relates to the technical field of interference spectrum imager, in particular to a phase error correction method and device of an interference spectrum imager. Background technique [0002] Interferometric spectral imaging technology is a new type of information acquisition technology developed in the 1990s. Due to its many theoretical advantages, it has high application value and potential in many fields such as environmental monitoring and resource investigation. Under the traction and promotion of application requirements, in just over a decade, interferometric imaging technology has developed rapidly, and various forms of interferometric imagers have emerged, which have played an important role in aerospace remote sensing. . [0003] Since the interference data obtained by the interference spectrum imager is a kind of intermediate data, it cannot be directly used by the user, and the spectral data for the user must be obtained after ...

Claims

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Application Information

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IPC IPC(8): G01J3/45
Inventor 景娟娟吕群波相里斌周锦松
Owner ACAD OF OPTO ELECTRONICS CHINESE ACAD OF SCI
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