Parameter measurement device and method for solution film on non-transparent solid surface

Abstract

The invention provides a parameter measurement device and method for a solution film on a non-transparent surface, based on a multi-wavelength laser absorption spectroscopic technology, and is used for synchronously measuring various parameters of the solution film on a non-transparent surface. The device is characterized by comprising a laser emitting unit, a laser coupling unit, a laser separation unit, a spectrum acquisition system and a computer, wherein laser emitted by the laser emitting unit is coupled and projected to the solution film to be measured, and is reflected into reflected lights respectively on the non-transparent solid surface and the surface of the solution film to be measured; the two beams of reflected lights are separated through the laser separation unit; light signals of the reflected light on the non-transparent solid surface are gathered through the spectrum acquisition system, and are converted into electric signals to be transmitted to the computer for data processing; the parameters of the solution film can be determined through inversion.

Description

technical field [0001] The invention relates to a measuring device and a measuring method, in particular to a device and method for synchronously measuring multiple parameters of a solution liquid film on a non-transmissive solid surface, and the device and method are universal. Background technique [0002] In various industrial processes, the phenomenon that liquid droplets impinge on solid surfaces to form liquid films widely exists, such as the formation of urea aqueous solution liquid films on automobile exhaust pipes in selective catalytic reduction (SCR) systems, etc. High-precision quantitative analysis of multiple parameters such as liquid film thickness can not only better reveal the physical nature of the extremely complex process of liquid film formation, flow and evaporation, but also play a very important role in optimizing various industrial processes involved. significance. [0003] For a liquid film on the surface of a transmissive solid (such as a transpar...

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Problems solved by technology

[0003] For a liquid film on the surface of a transmissive solid (such as a transparent quartz glass plate), such as figure 1 As shown in a, the laser directly passes through the liquid film and the transmission solid, and the parameters of the liquid film can be retrieved by placing a spectrum acquisition system under the transmission solid to obtain the information of the transmitted light intensity; but in actual industrial processes, the liquid film is usually in the non-transmission Formed on solid surfaces such as metals, such as figure 1 As shown in b, after the laser passes through the liquid film, it can no longer pass through the non-transmissive solid below to form transmitted light, but part of it is reflected on the surface of the liquid film to form the reflected light of the liquid film, and the other part passes through the liquid film of the solution in the non-transmissive Reflection occurs on the solid surface to form non-transmissive solid reflected light. Due to the interference of liquid film reflected light, it is impossible to directly detect the non-transmitted solid reflected light that has passed through the solution liquid film. Therefore, the liquid film parameter measurement device and method on the transmitted solid surface cannot be directly detected. Applied to non-transmissive solids

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