Outline structure of a contact hole
Patent Information
- Authority / Receiving Office
- CN ยท China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- WUHAN XINXIN SEMICON MFG CO LTD
- Publication Date
- 2021-01-12
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Figure 1 
Figure 2
Abstract
Description
technical field
[0001] The invention relates to the technical field of semiconductor technology, in particular to an outline structure of a contact hole. Background technique
[0002] With the development of the semiconductor process, the technical requirements of the semiconductor are becoming more and more stringent, and the size of the contact hole is continuously reduced, which poses more and more challenges to the deposition of the contact hole.
[0003] Currently, if figure 1 As shown, in the traditional process, the contact hole T1 is designed as a linear shape. When depositing tungsten on the contact hole T1 with a small size, it is difficult to form a barrier layer and a seed layer, which makes the electrical performance unstable. It is very difficult to deposit copper, and it is also difficult to meet the requirements of copper deposition, and it is easy to form voids, which in turn affects the yield and quality of wafers. Contents of the invention
[0004] In ...