Deep soil layering sampling device for soil survey and sampling

Abstract

The invention relates to a deep soil layering sampling device for soil survey and sampling. The device comprises a power component, a connecting member and a soil sampling member, wherein the soil sampling member is detachably connected at the lower end of the connecting member, and inside of the soil removing member is a hollow structure used for loading soil; the power member is detachably coupled to the upper end of the connecting member and applies power to the soil sampling member through the connecting member, thereby causing the soil sampling member to descend to a desired position in the soil to obtain a soil sample of a corresponding depth level; and a trench for facilitating the removal of soil inside is provided on the side wall of the soil sampling member. The invention has thebeneficial effects of developing a portable semi-automatic dynamic deep soil layering sampling device, which can completely acquire the soil profile layer, is suitable for deep soil sampling of soilunder various environmental conditions, and can perform quantitative treatment on sampling depth and soil quantity, thereby reducing the labor intensity, improving the accuracy and efficiency of soilsampling, and effectively solving the shortcomings of existing soil sampling methods and soil sampling devices.

Description

technical field [0001] The invention relates to the field of soil quality research, in particular to a middle-deep soil layered sampling device for soil investigation and sampling. Background technique [0002] Obtaining in situ soil property testing data through soil sample collection is a key link in soil research. Obtaining a large number of surface soil samples in field investigations is labor-intensive, and obtaining deep soil samples is a time-consuming and labor-intensive task. The traditional method is to excavate the soil profile, and then collect soil samples according to different soil depths on the soil profile. Soil profile excavation is not only labor-intensive, but also greatly damages the soil structure. The operation of obtaining deep soil samples with a thrust soil drill is relatively simple, and the labor intensity is slightly reduced. However, it is difficult for the soil drill to descend in the soil layer with high hardness. At present, there is also...

AI Technical Summary

Problems solved by technology

However, in the hard soil layer area, it is difficult for the earth drill to go down

At present, there are also applications of powered deep earth extractors, but their structures are complex, their weight is too large, and they require power support, making it inconvenient to carry them for field surveys.

Moreover, it is difficult to grasp the depth of soil sampling when sampling deep soil, and it is difficult to obtain soil samples at the target depth, and the error will greatly increase

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