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Ion extraction device and extraction method thereof

An extraction device and ion technology, which are used in electronic/ion optical devices, parts of particle separator tubes, mass spectrometers, etc., can solve the problems of complex ion source structure, inconvenient operation, etc., to expand the scope of use, facilitate installation and Debugging and eliminating the effect of discharge phenomenon

Active Publication Date: 2019-05-24
GUANGZHOU RIBOBIO
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

For example, proteins produce positive ions, and nucleic acids produce negative ions, while conventional ion sources usually only detect ions of the same polarity
In addition, the existing ion source technology teaches that the laser is irradiated on the sample as vertically as possible to make the sample ionize better, so some ion sources or instruments need to use mirrors to adjust the optical path due to structural problems, so that the ions The source structure is complex and inconvenient to operate

Method used

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  • Ion extraction device and extraction method thereof
  • Ion extraction device and extraction method thereof
  • Ion extraction device and extraction method thereof

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Embodiment Construction

[0026] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0027] Such as figure 1 , figure 2 As shown, an ion extraction device provided by the present invention includes an ion extraction system 1 , an ion acceleration system 2 , a grounded main base 3 and an ion focusing system 4 arranged coaxially. Among them, the ion extraction system 1 is used to extract ions; the ion acceleration system 2 is arranged downstream of the ion extraction system 1, and it is respectively connected with the ion extraction system 1 and the grounded main base 3 through two insulating columns 5, and in the ion extraction system 1. An ion acceleration area is formed between the ion acceleration system 2, the insulating column 5 and the grounded main base 3, and the voltage difference in the ion acceleration area is more than 20 kV; the grounded main base 3 is arranged downstream of the ion acceleration system 2, and its A cent...

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Abstract

The invention relates to an ion extraction device and an extraction method thereof. The ion extraction device is characterized by comprising an ion extraction system, an ion acceleration system, a grounding main base and an ion focusing system which are coaxially arranged. The ion extraction system is used for extracting ions. The ion acceleration system is arranged at the downstream of the ion extraction system and is connected with the ion extraction system through an insulator. An ion acceleration area is formed between the ion acceleration system and the ion extraction system. The grounding main base is arranged at the downstream of the ion acceleration system and is internally provided with a central ion through hole for ion flight, a laser incident hole for laser incident and a camera observation hole for camera observation. The ion focusing system is arranged at the downstream of the grounding main base and is used for focusing the ions flying out of the grounding main base andleading the focused ions to a field-free area for subsequent qualitative and / or quantitative detection of the ions. The device and the method can be widely applied to the field of ion detection.

Description

technical field [0001] The invention relates to the field of detection and analysis instruments, in particular to an ion extraction device and an extraction method thereof. Background technique [0002] Since the charged particles just electrolyzed by the mass spectrometer are a bunch of discrete ions, they need to be treated by a special electric field of the ion source to become the ions detected by the detector, so the ion source is an essential part of the mass spectrometer. The ion source is composed of multiple electrode plates and insulating modules, so as to construct the required electric field for the extraction, acceleration and focusing of charged particles, so that charged particles of different masses enter the field-free flight zone at the same speed direction but at different speeds. The ions with the same mass-to-charge ratio arrive at the detector at the same time, and the ions with different mass-to-charge ratios arrive at the detector at different times, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01J49/06H01J49/26
Inventor 张必良何宇忠卢明华张奕杰石志鹏
Owner GUANGZHOU RIBOBIO
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