Active reflective surface shape adjustment method based on axial gain measurement

A technology of axial gain and adjustment method, which is applied to electrical components, complex mathematical operations, antennas, etc., and can solve problems such as system measurement deviation and affecting the final surface adjustment accuracy.

Active Publication Date: 2019-06-11
ZIJINSHAN ASTRONOMICAL OBSERVATORY CHINESE ACAD OF SCI
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Problems solved by technology

For example, radio holographic measurement requires a coherent signal source as a beacon, and the telescope is equipped with a dedicated holographic receiver and a reference antenna or horn that provides phase reference, so this method is mainly used in the antenna assembly stage, and cannot be used in the

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  • Active reflective surface shape adjustment method based on axial gain measurement
  • Active reflective surface shape adjustment method based on axial gain measurement
  • Active reflective surface shape adjustment method based on axial gain measurement

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Embodiment Construction

[0038] The present invention is described in further detail now in conjunction with accompanying drawing.

[0039] Application of the present invention proposes such as figure 1 The shown method of adjusting the shape of the active reflector based on axial gain measurement adjusts the shape of the main reflector of a submillimeter-wave antenna with a 1.2-meter aperture. The antenna adopts the Cassegrain dual-reflector system, in which the main reflector is a rotating paraboloid with a focal ratio of 0.4, which is spliced ​​by six panels made of carbon fiber composite materials, and each panel is supported by three displacement actuators to achieve precise position. The beacon source required for gain measurement is generated by an artificial frequency multiplier signal source in the 3mm band. The signal source is erected on a hillside 26.6 meters away from the antenna. The axis of the antenna points to the signal source and forms an elevation angle of about 10 degrees with th...

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Abstract

The invention discloses an active reflective surface shape adjustment method based on axial gain measurement. According to the method, a series of micro-disturbance is applied to a reflective surfaceshape through an actuator network in an active surface system, and the change in antenna axial gain is measured in the disturbing process; a group of orthogonal basis functions defined on an antenna port surface are used as disturbance modes to disturb the surface shape one by one, and under each disturbance mode, a curve of the change in the antenna axial gain along with the disturbance quantityis recorded, and the optimal adjustment quantity under each disturbance mode is fitted out of the corresponding curve; and through a series of disturbance, measurement and adjustment processes, finally the antenna gain can reach a maximal value, and the surface shape error can reach a minimal value. The method has a low requirement on a detector, and a single-pixel power detector can be used; in the running process of a telescope, a scientific receiver and an astronomical point source target can be directly utilized to carry out surface shape measurement and adjustment frequently, and therefore the observation efficiency of the telescope in the running process is maintained.

Description

technical field [0001] The invention relates to an active reflection surface shape adjustment method based on axial gain measurement, which is mainly applied to large radio telescopes. Background technique [0002] For radio telescopes in the form of reflector antennas, the surface shape accuracy of the reflector is an important performance index, which directly determines the highest frequency band that the telescope can work and the observation efficiency. The main reflector of modern large radio telescopes is usually spliced ​​by panels of smaller size. These panels are supported and actively adjusted by displacement actuators, and finally spliced ​​into the required large-aperture reflector. Such reflector forms are also called active reflectors or active surface systems. Although the active surface system reduces the difficulty and cost of reflector processing, it requires To adjust hundreds of meters-sized panels to their ideal positions, the maximum allowable deviati...

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Application Information

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IPC IPC(8): H01Q15/14H01Q19/10G06F17/17
Inventor 娄铮左营喜钱元张晓玲康浩然
Owner ZIJINSHAN ASTRONOMICAL OBSERVATORY CHINESE ACAD OF SCI
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