The invention provides a method for correcting near-field test phases of a millimeter wave plane. The method comprises the steps that step 1, a set XY plane is scanned and four points in a zone with strong signals are selected to serve as phase sampling points; step 2, preset periods are set, plane scanning is conducted on the four points, and collection moments, collection data and collection positions of the four points in each period are determined; step 3, according to data variable quantity of the selected four points, the phase of each point in the scanned plane is corrected; step 4, Fourier transform is conducted on the corrected data of the whole scanned plane, far-field data are calculated through near-field data, and the near-field far-field transformation formula is . According to the technical scheme, a function relationship, corresponding to the sampling points, of phase drift and time is established through the method that the positions of the appointed sampling points on the scanned plane and the sampling data in the positions are recorded, phase compensation of the data of the whole scanned plane is achieved through the interpolation mode, and therefore the measurement accuracy of a near-field measurement system under a millimeter wave frequency band is improved.