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198 results about "Phase drift" patented technology

Spectral measurement method based on optical frequency combs

The invention discloses a spectral measurement method based on optical frequency combs. The measurement method is characterized in that firstly, an annular laser resonant cavity based on a phase modulator is actively modulated by use of a first optical frequency comb controllable in time domain and frequency domain so that the annular laser resonant cavity is converted into a second optical frequency comb having tiny difference in repetition frequency with the first optical frequency comb, and spectrum detection is performed on the two optical frequency combs to obtain an interference signal carrying the information of a sample to be tested, and meanwhile, frequency beating is performed on the two optical frequency combs and continuous frequency stabilized laser, respectively, the difference frequency signal of two obtained beat frequency signals is mixed with the interference signal, and a signal obtained by virtue of detection mixing is taken as a spectral signal for Fourier analysis so as to reduce the optical information of the sample to be tested. The spectral measurement method has the advantages that the error of the spectral detection due to own phase drift of a dual-optical comb system can be eliminated, and therefore, the resolution and the detection accuracy of the spectral measurement can be improved.
Owner:CHONGQING HUAPU INFORMATION TECH CO LTD

Method and device for measuring harmonic impedance

InactiveCN101706532ASolving Harmonic Impedance Measurement ChallengesAvoid errorsSpectral/fourier analysisResistance/reactance/impedenceMeasurement deviceTime signal
The invention relates to a method and a device for measuring harmonic impedance. Aiming at the main error source in an 'incremental method' of the method for measuring the harmonic impedance, namely the problem of the synchronization of frequency deviation and two different time signal phase angles, the invention discloses a 'bisynchronous incremental method', and develops a corresponding testing instrument, wherein the first synchronization is that a reference phase is synchronized with the system cycle to solve the drifting problem of the reference phase; and the second synchronization is that the sampling frequency is synchronized with the system frequency by tracking the changes of the system frequency by a hardware phase lock circuit and generating the sampling frequency by the phase lock circuit. The device for measuring the harmonic impedance comprises a synchronous circuit of the sampling frequency and the system frequency and a synchronous circuit of the phase and the system cycle. The 'bisynchronous incremental method' solves the error problems caused by benchmark reference phases, system frequency fluctuations and the like in the 'incremental method'; the device has a simple principle and is easy to implement; and the method and the device reach the engineering application level and solve the problem of measuring the harmonic impedance in the generation of electricity.
Owner:国网电力科学研究院武汉能效测评有限公司

Method for correcting near-field test phases of millimeter wave plane

The invention provides a method for correcting near-field test phases of a millimeter wave plane. The method comprises the steps that step 1, a set XY plane is scanned and four points in a zone with strong signals are selected to serve as phase sampling points; step 2, preset periods are set, plane scanning is conducted on the four points, and collection moments, collection data and collection positions of the four points in each period are determined; step 3, according to data variable quantity of the selected four points, the phase of each point in the scanned plane is corrected; step 4, Fourier transform is conducted on the corrected data of the whole scanned plane, far-field data are calculated through near-field data, and the near-field far-field transformation formula is . According to the technical scheme, a function relationship, corresponding to the sampling points, of phase drift and time is established through the method that the positions of the appointed sampling points on the scanned plane and the sampling data in the positions are recorded, phase compensation of the data of the whole scanned plane is achieved through the interpolation mode, and therefore the measurement accuracy of a near-field measurement system under a millimeter wave frequency band is improved.
Owner:THE 41ST INST OF CHINA ELECTRONICS TECH GRP

Capacitance humidity sensor with temperature drift compensation and making method thereof

The invention discloses a capacitance humidity sensor with temperature drift compensation and a making method thereof. The sensor main body adopts the surface micro-mechanical machining technology to form an isolation layer on a semiconductor substrate and a humidity sensing cantilever and upper and lower electrodes on the isolation layer, wherein a first humidity sensitive material layer, a humidity isolation layer and a second humidity sensitive material layer are piled up on the humidity sensing cantilever from bottom to top; and the upper electrode is covered on the lower surface of the first humidity sensitive material layer and forms sensitive capacitance with the lower electrode. When the ambient humidity changes, the size changes of the first humidity sensitive material layer and the second humidity sensitive material layer are different, so as to enable the humidity sensing cantilever to be deformed and then the upper electrode to be deformed, as a result, the capacitance between the upper and the lower electrodes is changed, and the change of the capacitance value can represent the change of the ambient temperature. When the ambient temperature changes, if the size changes of the two humidity sensitive material layers of the humidity sensing cantilever are the same, the effect of phase drift compensation is achieved, and the capacitance humidity sensor with the temperature drift compensation has the outstanding property of low temperature drift.
Owner:SOUTHEAST UNIV

Laser interference lithography system with pattern locking function

ActiveCN103092002AWith graphics lock functionLock high speedPhotomechanical exposure apparatusMicrolithography exposure apparatusGratingBeam splitter
A laser interference lithography system with a pattern locking function comprises a laser, a reflector, a beam splitter, a substrate stage, a substrate and a pattern locking device. A laser beam emitted by the laser is split into an exposure beam and a reference beam by a spectroscope; the exposure beam passes through the beam splitter, and is reflected to the substrate on the substrate stage by the reflector to realize interference; the interference patterns can realize pattern record transfer by exposing the substrate; and the patterns are locked by the pattern locking device to prevent pattern drift during exposure. The pattern locking device includes a null phase meter, an electronic signal processing component, a controller, a driver and a phase modulation executing, wherein the null phase meter is used for measuring pattern phase drift; the pattern phase drift is fed back to the controller through the signal processing component; and the controller controls the phase modulation executer to realize phase locking through the driver. The laser interference lithography system provided by the invention has the advantages of simple structure, high pattern locking accuracy and the like, and is a key system for realizing large-area high-accuracy grating fabrication.
Owner:TSINGHUA UNIV +1

Digital array radar amplitude-phase monitoring and calibration method based on optical fiber delay system

The invention relates to a digital array radar amplitude-phase monitoring and calibration method based on an optical fiber delay system. The method mainly includes the steps that a radar array front array element and an array front monitoring coupled array element are utilized to collect amplitude-phase data of all uplink channels and all downlink channels of the radar array front array element in a mutual coupling mode, amplitude-phase monitoring of all the uplinks and the downlinks of a radar array front is finished, when amplitude-phase correction and calibration need to be conducted on the array front, the difference value between the amplitude-phase data and factory data is acquired through amplitude-phase monitoring, and then amplitude-phase calibration of the uplinks and the downlinks of the array front is finished after the difference value is corrected. According to the method, the optical fiber delay system is introduced to separate transmitting time from receiving time, within a transmitting monitoring operation time sequence, the monitored channels work in a deep blanking state, optical fiber amplitude-phase drifting self-calibration is finished, and accuracy of monitored data is guaranteed. The method has the advantages of being good in real-time performance, convenient and quick to operate, and good in cost performance. The presentation and engineering realization of the method have high practical application value in the field of digital array radar monitoring and calibration.
Owner:THE 724TH RES INST OF CHINA SHIPBUILDING IND

Stability control device for transmission spectrums of optical fiber current transducer

The invention discloses a stability control device for transmission spectrums of an optical fiber current transducer, and belongs to the technical field of optical fiber transmission. According to the stability control device, the front end of a polarizer is provided with a first optical fiber filter, and the front end of a sensing unit is provided with a second optical fiber filter. According to the invention, the changes in the spectral form and power of optical waves induced by the drifting of a spectral window of an optical device caused by shaft-aligning errors and temperature in the optical fiber current transducer are eliminated, so that the transmission spectrum in the optical fiber current transducer is stable, thereby eliminating integral optical phase shifting errors of a Faraday effect of the sensing unit. A new scheme for optical paths of all-optical-fiber current transducers based on an optical fiber filter provided by the invention solves the problem that in a traditional optical path, a spectral window of an optical device drifts due to temperature drift and difficulty in accurate shaft-aligning among optical fibers or between an optical fiber and a device, eliminates the influence of spectrum fluctuation on error signals, expands the range of a system for tracking direct-current random phase drift, and improves the anti-jamming capability and stability of the system.
Owner:开元锐德(北京)光电科技有限公司

Motion compensation method and system in three-dimensional imaging of dynamic object

The invention relates to a motion compensation method and system in three-dimensional imaging of a dynamic object. The motion compensation method comprises the following steps: firstly, carrying out primary estimation on a motion error; then, reestimating the motion error of each pixel of which the root-mean-square error is greater than a set threshold; calculating a correction estimation value of a phase of each pixel of which the root-mean-square error is greater than the set threshold according to the reestimated motion error and fixed phase drift and original deforming bar chart data of the system; replacing an initial estimation value of the phase of the corresponding pixel with the correction estimation value to form a wrapped phase diagram subjected to motion compensation; reestablishing a depth phase subjected to motion compensation by using the wrapped phase diagram subjected to motion compensation. The motion compensation method and system disclosed by the invention have relatively high reliability and relatively good compensation effect on the errors caused by motion, so that the dynamic surface measurement precision is greatly improved and the dynamic range of system measurement is expanded. The motion compensation method and system are applicable to a three-dimensional measurement system consisting of a projector and a single camera or two cameras, or motion error compensation of an absolute phase diagram subjected to phase unwrapping.
Owner:SHENZHEN UNIV
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