VI source measurement data acquisition and display method

A technology of measurement data and display method, which is applied in the field of VI source measurement data collection and display, can solve problems such as the complexity of data collection and acquisition methods in the measurement process, and achieve the effect of reducing complex procedures

Inactive Publication Date: 2019-07-05
HANGZHOU CHANGCHUAN TECH CO LTD
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  • Claims
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Problems solved by technology

[0006] In view of the complexity of the acquisition and acquisition methods of measurement process data in the above-mentioned prior art, as well as the shortcomings in the visual display of data, the present invention provides a VI source measurement data acquisition and display method

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  • VI source measurement data acquisition and display method
  • VI source measurement data acquisition and display method
  • VI source measurement data acquisition and display method

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Embodiment Construction

[0021] The specific embodiments of the present invention will be further specifically described below through specific embodiments in conjunction with the accompanying drawings.

[0022] A method for collecting and displaying VI source measurement data (see attached figure 1 ) The PC-side software includes a PC-side control module that executes the PC-side control steps, a PC-side data module that executes the PC-side data steps, and a PC-side display module that executes the PC-side display steps.

[0023] A method for collecting and displaying VI source measurement data is characterized in that it is applicable to a PC end configured with a PCI_E high-speed interface card, the PC end is connected with an FPGA chip through a PCI_E high-speed interface card, and the FPGA chip obtains hardware through an AD sampling circuit The VI source measurement data of the resource board includes the following steps:

[0024] Step 1, the FPGA chip transmits the data collected by the AD sa...

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Abstract

The invention relates to a VI source measurement data acquisition and display method. The deficiencies of the prior art are solved. The technical solution is applicable to a PC end configured with a PCI_E high-speed interface card. The PC end is connected with the FPGA chip through the PCI_E high-speed interface card. The FPGA chip acquires the VI source measurement data of a hardware resource board card through an AD sampling circuit. The method comprises the steps that 1 the FPGA chip transmits data collected by the AD sampling circuit to the PC end through the PCI_E high-speed interface card; and 2 the PC end processes the data in a graphical manner for display, and a visual operation mode is provided for a user to view analysis data.

Description

technical field [0001] The invention relates to the technical field of semiconductor testing, in particular to a method for collecting and displaying VI source measurement data. Background technique [0002] In the field of semiconductor testing, for the measurement of a circuit under a certain condition, most manufacturers' solutions are to perform multiple measurements under the same conditions, and sample these test results, and then calculate and process these test results according to a specific algorithm. The calculated value is taken as the data result of this measurement of the test system. [0003] The above-mentioned final measurement results will be provided to users to view, use and save in different ways for each testing machine. However, there are still many deficiencies in saving and displaying the original data obtained by multiple sampling before the algorithm processing. [0004] If it is necessary to view the intermediate process of measurement, each man...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26
CPCG01R31/2601G01R31/2603
Inventor 金睿钟锋浩林越来
Owner HANGZHOU CHANGCHUAN TECH CO LTD
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