A wide working frequency band reflective electrical thickness test method

A technology of working frequency band and testing method, which is applied in the field of wide working frequency band reflection electrical thickness testing, and can solve the problems that restrict the direct application of reflection method, and the reflection coefficient phase cannot reflect IPD monotonously.

Active Publication Date: 2021-04-30
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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Problems solved by technology

[0005] Due to the double mutation of the electromagnetic wave transmission medium and the waveguide structure, there is often a serious mismatch between the waveguide probe of the microwave reflectometer and the outer wall of the radome, and it is difficult to satisfy Γ in most engineering applications. IPD Intensity greater than Γ port As a result, the measured reflection coefficient phase cannot reflect the change of IPD monotonously, which seriously restricts the direct application of reflection method in electrical thickness measurement.

Method used

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  • A wide working frequency band reflective electrical thickness test method
  • A wide working frequency band reflective electrical thickness test method

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Embodiment Construction

[0021] Below in conjunction with accompanying drawing and specific embodiment the present invention is described in further detail:

[0022] A wide working frequency band reflective electrical thickness testing method, comprising the following steps:

[0023] Step 1: Take the two symmetrical ports of the Magic Wave T as the reflection measurement ports, connect them to the radome under test and the equivalent half-space dielectric load respectively, and use the in-phase port and the anti-phase port of the Magic Wave T as the excitation signal input port and reflection Signal output detection port; such as figure 2 shown;

[0024] Step 2: Utilize the transmission characteristics of the waveguide magic T to isolate the signal pass-through from the input port to the output port, and symmetrically cancel the non-matching reflection component Γ port transmission to the output port;

[0025] Step 3: IPD reflection signal Γ of the radome under test IPD Equivalent IPD reflection ...

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Abstract

The invention discloses a reflection-type electrical thickness test method with a wide working frequency band, which belongs to the technical field of testing. The invention realizes the automatic mismatch reflection of the outer surface of the radome under test through the combination of the equivalent half-space dielectric load and the waveguide magic T. Offset, and transmit the reflected signal component containing IPD information to the anti-phase port, and be naturally isolated from the same direction port, transform the reflection measurement into the transmission measurement, reduce the measurement difficulty, solve the engineering application problem of the reflection electrical thickness measurement method, and Provides good measurement linearity.

Description

technical field [0001] The invention belongs to the technical field of testing, and in particular relates to a reflection-type electrical thickness testing method with a wide working frequency band. Background technique [0002] Electric thickness refers to the increase in wave number relative to the vacuum path of the same geometric size when the electromagnetic wave radiation passes through the non-vacuum medium space, which can be equivalent to the phase delay of the electromagnetic wave propagating in the medium relative to the vacuum increase, called insertion phase delay (IPD) . The IPD parameter is of great significance to the design of the radome and must be measured during the fabrication process. The traditional IPD test is to place the radome under test between the microwave transceiver antennas, and measure the transmission phase difference caused by different radome for comparative measurement, or compare it with the transmission phase without placing the radom...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B7/06G01R29/10
CPCG01B7/06G01R29/10
Inventor 郭利强吴强冷朋
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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