Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Software automatic tester

A tester and automatic technology, applied in the field of software automatic tester, can solve problems such as low accuracy, heavy workload, and large repeatability, and achieve the effects of shortening the development cycle, improving efficiency, and high accuracy

Inactive Publication Date: 2020-05-05
麻城创之力商务服务有限公司
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At present, the method of manual testing has been adopted at home and abroad, and there is no concept of automatic testing of electronic product software.
Because of the numerous, complex, and repetitive points of electronic product software testing, manual testing of software has always had disadvantages such as huge workload, easy fatigue, easy omission of key points, human misoperation, slow speed, and low accuracy. Affect product development cycle

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Software automatic tester

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0013] Below in conjunction with accompanying drawing, the application is further described, see Fig. 1, the application includes main control CPU11, signal, A / D acquisition unit 12, latch 13, analog switch array unit 14, communication interface unit 15; The input end of the signal A / D acquisition unit 12 is connected with the liquid crystal display of the electronic product to be tested for collecting the display information of the liquid crystal display; the output end of the signal A / D acquisition unit 12 is connected with the test result input end of the main control CPU11 Connect, be used for transmitting test result to main control CPU11; The input end of described latch 13 is connected with the operation signal output end of main control CPU11, is used for temporarily storing the test operation signal of main control CPU11 output; The latch 13 The output end is connected with the input end of the analog switch array unit 14, and is used to transmit the test operation sig...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to test equipment for software in the development stage of electronic products, in particular to an automatic software tester which comprises a main control CPU, a signal A / D acquisition unit, a latch, an analog switch array unit and a communication interface unit. Wherein the input end of the signal and A / D acquisition unit is connected with a liquid crystal display screen of an electronic product to be tested, the output end of the signal A / D acquisition unit is connected with the test result input end of the main control CPU, and the input end of the latch is connectedwith the main control CPU. The operation signal output end of the latch is connected with the input end of the analog switch array unit, the output end of the analog switch array unit is connected with a keyboard array unit of an electronic product to be tested, and the communication interface unit is connected with the main control CPU. Compared with the traditional manual test software, the software automatic tester has the advantages that the test is accurate, the efficiency is improved by more than 10 times, and meanwhile, the defects of omission, misoperation and the like in manual operation are avoided.

Description

technical field [0001] The application relates to testing equipment for software in the development stage of electronic products, in particular to a software automatic tester. Background technique [0002] In the field of software testing in the current electronic product development stage, according to statistics, the time of electronic product software testing accounts for about 2 / 3 of the entire product development cycle, so the speed of software testing will greatly affect the development speed of the entire product. At present, both at home and abroad have been using manual testing methods, and there is no concept of automatic testing of electronic product software. Because of the numerous, complex, and repetitive points of electronic product software testing, manual testing of software has always had disadvantages such as huge workload, easy fatigue, easy omission of key points, human misoperation, slow speed, and low accuracy. affect the product development cycle. ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
CPCG06F11/3672G06F11/3692G06F11/3696
Inventor 江泉
Owner 麻城创之力商务服务有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com