123results about How to "No omissions" patented technology

The invention discloses a flaw sagger automatic eliminating and replacing device used in an electronic kiln automatic production line, and belongs to the technical field of electronic kiln supporting facilities. The electronic kiln automatic production line comprises an automatic sagger conveying mechanism, a first sagger conveying roller pivoting supporting beam, a second sagger conveying roller pivoting supporting beam and a set of sagger conveying rollers, wherein the automatic sagger conveying mechanism comprises an automatic sagger conveying rack, the first sagger conveying roller pivoting supporting beam and the second sagger conveying roller pivoting supporting beam are arranged in parallel in the length direction of the automatic sagger conveying rack, and the sagger conveying rollers move under the driving of a sagger conveying roller driving mechanism and are supported between the first sagger conveying roller pivoting supporting beam and the second sagger conveying roller pivoting supporting beam. The flaw sagger automatic eliminating and replacing device comprises a compensated sagger automatic conveying mechanism, a sagger replacement mechanism and a sagger replacement mechanism driving acting cylinder, wherein the compensated sagger automatic conveying mechanism is supported with the sagger replacement mechanism, and the sagger replacement mechanism driving acting cylinder is arranged on the compensated sagger automatic conveying mechanism and connected with the sagger replacement mechanism. The labor intensity of workers is relieved, the missing phenomenon is avoided, valuable labor force resources are saved, and the accident that the limbs of the workers are injured by saggers is completely avoided.

In systems according to conventional retrieval techniques for restricting a candidate when there are a plurality of candidates as retrieval results, a method involves such a problem that a huge number of candidates are selected in order to prevent omission of candidates, whereby the administration cost is increased, and another method involves such a problem that all candidates are always subjected to processing, whereby the processing period is prolonged and the response performance is lowered A retrieval device according to this invention comprises: a retrieval history storage means which stores a retrieval history including a content inputted from an input means and a candidate list; a narrowing-down system selection means which selects, according to the content of the stored retrieval history, a narrowing-down method from a system of limiting subjects to be retrieved to high-order candidates or a system of re- retrieving on the basis of input in the past and sets retrieval candidates and scores thereof from the retrieval history by the selected narrowing-down system; a candidate score update means which updates the candidate scores by referring to an index for retrieval on the basis of a character string received from the input means; a candidate determination means which determines candidates to be presented, on the basis of the number of the updated candidates and the distribution of the scores; and a candidate presentation means which presents the determined candidates to a user by referring to name information data.

The invention discloses a flaw sagger automatic eliminating and replacing device used in an electronic kiln automatic production line, and belongs to the technical field of electronic kiln supporting facilities. The electronic kiln automatic production line comprises an automatic sagger conveying mechanism, a first sagger conveying roller pivoting supporting beam, a second sagger conveying roller pivoting supporting beam and a set of sagger conveying rollers, wherein the automatic sagger conveying mechanism comprises an automatic sagger conveying rack, the first sagger conveying roller pivoting supporting beam and the second sagger conveying roller pivoting supporting beam are arranged in parallel in the length direction of the automatic sagger conveying rack, and the sagger conveying rollers move under the driving of a sagger conveying roller driving mechanism and are supported between the first sagger conveying roller pivoting supporting beam and the second sagger conveying roller pivoting supporting beam. The flaw sagger automatic eliminating and replacing device comprises a compensated sagger automatic conveying mechanism, a sagger replacement mechanism and a sagger replacement mechanism driving acting cylinder, wherein the compensated sagger automatic conveying mechanism is supported with the sagger replacement mechanism, and the sagger replacement mechanism driving acting cylinder is arranged on the compensated sagger automatic conveying mechanism and connected with the sagger replacement mechanism. The labor intensity of workers is relieved, the missing phenomenon is avoided, valuable labor force resources are saved, and the accident that the limbs of the workers are injured by saggers is completely avoided.

The invention discloses a test task operation scheduling method in support of parallel tests. The method is based on a user interface and a task scheduling table. Test tasks are stored in the task scheduling table column by column. For any one behavior test task item in any one column, the method comprises the steps of accessing the task scheduling table; establishing a column index and setting the initial value of the column index to be a starting column; accessing and starting test tasks corresponding to the column index of the task scheduling table, and starting the test task items corresponding to the column index line by line; establishing communication intermediary objects, calling the test task items in the step 3 in an asynchronous calling mode, and transmitting the communication intermediary objects to the test task items; finishing the test task items; and adding the column index up with one, and returning to the step 3 until the number of the column indexes is equal to the total column number of the task scheduling table. The method has the advantages that through adoption of a synchronization method of calling the test tasks asynchronously, many inherent complicated problems in multi-thread design are hidden; moreover, the advantages of a multi-thread application are exerted; and the software development work is simplified.

The application provides a multi-core insulation automatic detector and system. The multi-core insulation automatic detector comprises an input switching circuit, a measurement sampling circuit, an analog-to-digital conversion circuit and a processing unit, wherein the input switching circuit is electrically connected with the measurement sampling circuit; the measurement sampling circuit and theanalog-to-digital conversion circuit are electrically connected with each other; and the processing unit is electrically connected with the input switching circuit and the measurement sampling circuitrespectively. Through adoption of the multi-core insulation automatic detector designed by the application, the insulation resistance of a multi-core part can be detected automatically; cores under detection are prevented from missing; the workload of staff is reduced greatly; and security is ensured.

The invention discloses an artificial board surface defect detection method. The method comprises the following steps of 1) continuously scanning the surface of the artificial board by using a plurality of high-definition scanners, storing an image obtained by scanning in a computer connected with the high-definition scanner, sequentially arranging the high-definition scanners in the width direction of the artificial board, setting scanning areas of the high-definition scanners to be square areas with fixed sizes, covering the width area of the artificial board in the scanning area after all square areas are overlapped and enabling the adjacent square areas to be partially overlapped, 2) defining a plurality of obtained position relations of the scanning images on a computer through a setcoordinate system, 3) performing defect processing and statistics of each image obtained by scanning, and 4) enabling the computer to output the type and the position of the defect in each scanning image. According to the defect detection method, the situations that defect detection is omitted, and small defects cannot be detected can be avoided, and the integrity and the accuracy of defect detection are improved.