Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Multichannel gradient magnetic field measuring device based on atomic spin effect

A gradient magnetic field and atomic spin technology is applied in the fields of magnetic field measurement, magnetic gradient measurement, and magnetic field measurement using electromagnetic devices, which can solve the problems of unfavorable miniaturization, low sensitivity, and poor flexibility. The effect of improved environmental common mode noise suppression ability, strong ability to resist external interference, and large baseline length

Active Publication Date: 2020-11-13
BEIHANG UNIV
View PDF5 Cites 5 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] In view of this, the present invention provides a multi-channel gradient magnetic field measurement device based on the atomic spin effect. The technical problem to be solved is: to overcome the shortcomings of the existing magnetic gradient measurement technology such as poor flexibility, low sensitivity, and unfavorable miniaturization. Based on the atomic spin effect, a single beam of probe light can be used to measure the spatial magnetic field. At the same time, there are multiple parallel probe beams inside the device, which can detect the magnetic field at multiple positions in space at the same time. The gradient difference of the magnetic field at different positions is used to realize the spatial gradient. Magnetic field measurement

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Multichannel gradient magnetic field measuring device based on atomic spin effect
  • Multichannel gradient magnetic field measuring device based on atomic spin effect
  • Multichannel gradient magnetic field measuring device based on atomic spin effect

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0020]Below with the accompanying drawings ( Figure 1-Figure 3 ) to illustrate the present invention.

[0021] figure 1 A schematic structural diagram of a multi-channel gradient magnetic field measurement device based on the atomic spin effect for implementing the present invention. figure 2 for figure 1 Schematic diagram of the detection part. figure 2 The optical rotation angles of the elliptically polarized light beams on the left side of the alkali metal atomic gas cell are the same, and the optical rotation angles of the elliptically polarized light beams on the right side of the alkali metal atomic gas cell vary, for example, the optical rotation angle changes from small to large from bottom to top , figure 2 The cross icon in the upper middle circle tilts the most to the right. image 3 for figure 1 Schematic diagram of the system response for the balanced photodetector output. refer to Figure 1 to Figure 3 As shown, a multi-channel gradient magnetic field...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a multichannel gradient magnetic field measuring device based on an atomic spin effect. The technical problem to be solved is to overcome the defects of poor flexibility, lowsensitivity, difficulty in miniaturization and the like of the existing magnetic gradient measurement technology; based on the atomic spin effect, space magnetic field measurement can be achieved through a single detection light beam, meanwhile, multiple paths of parallel detection light beams are arranged in the device, magnetic fields at multiple positions in space can be detected at the same time, gradient difference is conducted through the magnetic fields at different positions, and space gradient magnetic field measurement is achieved.

Description

technical field [0001] The invention relates to atomic magnetometer / gradiometer technology, in particular to a multi-channel gradient magnetic field measurement device based on atomic spin effect. Background technique [0002] With the continuous development of quantum technology and laser technology, the magnetic field measurement technology based on quantum spin ensemble control has developed rapidly and has been widely used in various fields, including: deep space and deep geomagnetic anomaly detection, mineral exploration, biological extremely weak magnetic field measurement etc. Among them, biological extremely weak magnetic measurement, such as heart and brain magnetic measurement, muscle magnetic measurement, cell measurement, etc., has great research significance. Cardio-encephalogram measurement has extremely important economic, social and scientific value: it can help rapid diagnosis of chest pain, early screening of coronary heart disease, measurement of abnormal...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/022
CPCG01R33/022
Inventor 周斌权尹凯峰柳治王婧闫业广尚慧宁
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com