Method and device for measuring delay performance of RapidIO switch chip
A technology for exchanging chips and performance, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of unable to exchange delay tests, etc., and achieve the effect of flexible data packet format
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[0030] It should be noted that, in the case of no conflict, the embodiments of the present invention and the features in the embodiments can be combined with each other.
[0031] The present invention will be described in detail below with reference to the accompanying drawings and examples.
[0032] Such as figure 1 As shown, a method for measuring the delay performance of a RapidIO switching chip, using the RTL code of the RapidIO switching chip as the DUT to be tested;
[0033] DUT comprises digital circuit code and analog circuit code, and described analog circuit code comprises Serdes model, is used for generating RapidIO protocol data message as test excitation, and reflects the actual sequential behavior of physical analog circuit; Described digital circuit code is in analog circuit code Driven by the corresponding clock beat, it is transmitted in the DUT;
[0034] The Serdes model is extracted from the actual analog circuit, which can accurately reflect the timing be...
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