Method and device for measuring delay performance of RapidIO switch chip
A technology for exchanging chips and performance, applied in the direction of measuring devices, measuring electricity, measuring electrical variables, etc., can solve the problems of unable to exchange delay tests, etc., and achieve the effect of flexible data packet format
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0030] It should be noted that the embodiments of the present invention and the features of the embodiments may be combined with each other under the condition of no conflict.
[0031] The present invention will be described in detail below with reference to the accompanying drawings and in conjunction with the embodiments.
[0032] like figure 1 As shown, a method for measuring the delay performance of a RapidIO switching chip, using the RTL code of the RapidIO switching chip as the DUT to be measured;
[0033] The DUT includes a digital circuit code and an analog circuit code, the analog circuit code includes a Serdes model, which is used to generate a RapidIO protocol data message as a test stimulus, and reflects the actual timing behavior of the physical analog circuit; the digital circuit code is in the analog circuit code. Transmission in the DUT driven by the corresponding clock beat;
[0034] The Serdes model is extracted from the actual analog circuit and can accura...
PUM
Login to View More Abstract
Description
Claims
Application Information
Login to View More 
