Equipment testing method and device, electronic equipment and storage medium

Abstract

The embodiment of the invention discloses an equipment testing method and device, electronic equipment and a storage medium. According to the embodiment of the invention, state information of equipment can be acquired; acquiring a burr simulation scene from a burr library according to the state information of the equipment; simulating burrs according to the burr simulation scene, and performing burr scene test on the equipment; and detecting the equipment subjected to the burr scene test to obtain a test result of the online keeping capability of the equipment. According to the invention, the equipment is automatically tested, various burr scene simulation tests are accurately completed, the test coverage is ensured to be large enough and refined, the test efficiency is improved, and the test cost is reduced. And when the equipment breaks down in the later period, the corresponding fault point can be found according to the corresponding burr simulation scene through the equipment testing method, automatic testing is achieved, the labor cost is reduced, the testing efficiency is improved, and the repairing cost after the equipment breaks down is reduced.

Description

technical field [0001] The present application relates to the computer field, and in particular to an equipment testing method, device, electronic equipment and storage medium. Background technique [0002] The ability to stay online is an important manifestation of the quality of smart devices, and an important indicator to judge whether smart devices can maintain a communication link with the cloud normally, so that smart devices can receive user control commands and report device status and other data in a timely manner. At present, testers generally use the proportion of the device's online time in a certain period of time to analyze the strength of the device's ability to maintain online. [0003] Since there are many test scenarios for maintaining the online capability of the device, each test scenario requires manual monitoring for a long time, and each test scenario must simulate the occurrence of corresponding glitches, so the test efficiency is low. Contents of t...

AI Technical Summary

Problems solved by technology

[0003] Since there are many test scenarios for maintaining the online capability of the device, each test scenario requires manual monitoring for a long time, and the corresponding glitches must be simulated in each test scenario, so the test efficiency is low

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