Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Universal micro-satellite comprehensive testing platform based on PXI system

A micro-satellite and comprehensive testing technology, which is applied in the testing of machines/structural components, the observation of aerospace vehicles, and measuring devices, etc., can solve the problems of high manual operation intensity, low versatility, and low intelligence, and achieve High degree of automation and intelligence, convenient judgment and maintenance, ensuring the effect of safety protection

Inactive Publication Date: 2010-07-07
SHANGHAI ENG CENT FOR MICROSATELLITES
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1) The versatility is not strong
[0005] Mainly follow the test method of Dasat. The test equipment includes stand-alone self-test equipment, comprehensive test equipment, etc., which are highly targeted. There are many test equipment but not related to each other. The unity and integrity of measurement and control tasks lack system support. One satellite needs to redevelop a set of comprehensive test equipment
[0006] 2) The degree of automation and intelligence is not high
[0007] In the current test process, the test data management ability is not strong, there is no log for test operation, the degree of intelligence is low, and the intensity of manual operation is relatively high, which increases the incidence of human error
[0008] 3) Insufficient openness and flexibility
[0009] The previous test equipment focused on a specific stage of satellite research and development, which was highly specific, resulting in insufficient flexibility of the test equipment and no room for upgrades and expansions

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Universal micro-satellite comprehensive testing platform based on PXI system
  • Universal micro-satellite comprehensive testing platform based on PXI system
  • Universal micro-satellite comprehensive testing platform based on PXI system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0050] see figure 1 , a general micro-satellite comprehensive test platform based on the PXI system, which is composed of the object under test, the direct measurement and control layer, the central control management layer and the terminal monitoring layer.

[0051] Due to the rapid development of testing technology to virtual technology in recent years. The automatic test system composed of virtual instruments has high reliability and strong flexibility, and the system can be transplanted from one system under test to another system under test through software configuration. VXI and PXI are representatives of virtual instruments, but VXI components are mostly high-end products, and the system is relatively large; PXI is a modular instrument system proposed and promoted by American NI in recent years, which has been widely used in various fields at home and abroad. The virtual software developed by NI Language LABVIEW and LABWINDOWS / CVI enable PXI hardware to obtain strong s...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A universal micro-satellite integrated test platform based on PXI system is formed by interconnecting tested object, direct measurement-control layer, central control management layer and terminal monitoring layer to each other.

Description

technical field [0001] The invention relates to a comprehensive test platform for micro-satellites, especially a general-purpose micro-satellite comprehensive test platform based on the PXI system. The test platform can complete the development of satellites by building a set of intelligent, flexible and comprehensive satellite automatic test systems. In the process, from the scheme simulation test to the impending launch test, the stimulus simulation and test of the whole star and stand-alone are carried out. Background technique [0002] The reduction of satellite development cost and cycle not only depends on the development of satellite technology itself, but also depends to a large extent on the improvement of satellite development tools. Satellite testing technology is an indispensable equipment in the process of satellite research and development. Along with the whole process of satellite research and development, the level of testing equipment represents the level of...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01M19/00B64G3/00G01M99/00
Inventor 孙宁余慧亮丁洲
Owner SHANGHAI ENG CENT FOR MICROSATELLITES
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com