Voltage comparator circuit and usage thereof

Abstract

A method for testing a circuit comprising a memory element, a voltage comparator and a supply selector, the circuit is configured to be connected to two power supplies, the voltage comparator is configured to provide an output indicative of a voltage difference between the two power supplies above a predetermined threshold, the supply selector is configured to select a power supply to feed power to the memory element in response to the output from the voltage comparator. The method comprises connecting the two power supplies to the circuit, wherein said connecting comprises causing the two power supplies to drive power to the memory element and to another element of the circuit, wherein the voltage different between the two power supplies is above the predetermined threshold. The method further comprises that in response to said connecting, the supply selector of the circuit is invoked and disconnects one power supply from the memory element; whereby stress testing the circuit, the stress testing tests the memory element without a voltage difference condition, the stress testing tests the another element with the voltage difference condition.

Description

CROSS REFERENCE TO RELATED APPLICATIONS[0001]This application is a continuation of U.S. patent application Ser. No. 14 / 476,886, filed on Sep. 4, 2014, which is hereby incorporated by reference.TECHNICAL FIELD[0002]The present disclosure relates to electrical engineering in general, and to circuits that provide voltage comparison, in particular.BACKGROUND[0003]Hardware characterization is a very costly and time consuming effort which involves many resources, multiple test pattern generation and expensive tester time. Designs using several power supplies usually require special care during testing and hardware characterization. Reducing testing time on the one hand and simplifying test patterns on the other hand are key for chip testing.[0004]During testing of a circuit design, stress testing may be performed. In some cases, the stress test includes performing voltage testing by connecting the circuit to two different power supplies. As a result, the circuit may be tested under differ...

AI Technical Summary

Benefits of technology

This solution enables efficient detection and management of voltage differences, reducing testing time and simplifying test patterns by automatically controlling power supply scenarios, thus protecting memory elements and allowing for effective stress testing of SRAM designs without disrupting other components.

Problems solved by technology

Hardware characterization is a very costly and time consuming effort which involves many resources, multiple test pattern generation and expensive tester time.

Different voltages may cause excessive current flows, Bias Temperature Instability (BTI) shifts, and even breaking of the circuit if too extreme.

Images