Patents
Literature
Patsnap Eureka AI that helps you search prior art, draft patents, and assess FTO risks, powered by patent and scientific literature data.

2results about How to "Save testing time" patented technology

A probe load resistance and load temperature rise tester

The utility model discloses a kind of probe load resistance and load temperature rise tester, operating machine table is correspondingly set with a group of lifting mechanism in the position of test station, the lifting mechanism is installed on the lifting part of pressure perception sensor for realizing pressure data detection;Test station is also provided with temperature sensor for realizing temperature detection;The utility model is by setting pressure perception sensor and detecting pressure needle, can accurately obtain the pressure data in the process of probe pressing down, and timely, intuitively feedback to test personnel by acquisition system, significantly improve the accuracy of probe load detection and data feedback efficiency.Simultaneously, resistance load test and load temperature rise test are integrated into probe load detection process, realize resistance load test by detecting pressure needle and product contact electricity, complete load temperature rise test using temperature sensor, realize the integration of multiple detection functions, greatly improve the detection efficiency, save detection time and cost.
Owner:DONGGUAN HONGDA MEASURING INSTR CO LTD

Intelligent door lock intelligent reliability test system and method

This invention discloses a smart lock intelligent reliability testing system and method. The system includes a control module, a reliability testing module, a data acquisition module, and a data analysis module. The control module is configured to send test commands to the reliability testing module; the reliability testing module is configured to respond to the test commands and drive the target smart lock to complete the test; the data acquisition module is configured to detect the operating status information of the target smart lock during the test and feed it back to the data analysis module; the data analysis module is configured to obtain test results based on the operating status information and feed them back to the control module for decision-making on subsequent test commands. This invention designs a safe, accurate, and intelligent reliability testing system, significantly saving testing manpower and time, and can simulate the actual application scenarios of smart locks, providing feedback on whether the smart lock truly opens and closes, thus ensuring the security and reliability of the smart lock.
Owner:SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI