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Automatic tester and test method thereof

A technology for automatic test equipment and test content, which is applied in the direction of measuring equipment, electronic circuit testing, and electrical measurement, can solve problems such as redundancy of test cases, reduce maintenance costs, improve reusability and portability, and reduce costs Effect

Inactive Publication Date: 2008-07-09
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0008] The present invention provides an automatic test device and method to solve the problem of redundant test cases

Method used

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  • Automatic tester and test method thereof
  • Automatic tester and test method thereof
  • Automatic tester and test method thereof

Examples

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Embodiment Construction

[0027] The essence of the invention is to make the realization of the test cases irrelevant to the types of equipment and single boards, and to construct a low-redundancy automatic test script that can automatically adapt to changes in equipment and single boards.

[0028] Please refer to image 3 As shown, the automatic testing device of the present invention includes at least one use case layer 1, at least one device interface layer 2 and a support layer 3 between the use case layer 1 and the device interface layer 2.

[0029]The use case layer 1 is used to describe the test steps encapsulated for the test function, and specify the supported measured objects and test content (for example, the input optical power is too high alarm test case, the RLOS alarm test case, the single board temperature limit alarm) . The use case script is the script description of the test case, which is the concrete embodiment of the test steps and test content. Through layered design, the scrip...

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Abstract

An automatic test device consists of exemplification layer used in test steps packaged for test function and used to assign tested object and test content supported by it, device interface layer used as device interface used by tested object to provide control and inquiry device information to outside, support layer between exemplification layer and device interface layer for shielding tested object difference and for packaging device interface as well as for providing unified operation interface and data access interface, and tested object device interface layer. The automatic test method is also disclosed.

Description

technical field [0001] The invention relates to automatic testing technology, in particular to a low-redundancy automatic testing device and method. Background technique [0002] Testing is the guarantee of successful delivery of high-quality products, and the tested objects include hardware (such as chips, single boards, etc.) and software. Taking the alarm test as an example, the equipment with alarm function can timely and correctly reflect the past and current operating status of the equipment through the alarm information, so that users and maintenance engineers can understand the operating status of the equipment in a timely manner and take appropriate actions to ensure the equipment's normal operation. Normal operation, so it has complete and accurate alarm detection, diagnosis, isolation, protection, recording, reporting, query and other functions are the characteristics of a good alarm handling equipment. Therefore, in the test, it is necessary to adopt an effectiv...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3193G01R31/28G06F11/277
Inventor 李刚
Owner HUAWEI TECH CO LTD
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