Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

High flux multiparameter imaging surface plasma resonance test instrument

A surface plasma and tester technology, applied in the field of detection, can solve the problems of not yet given multi-parameter quantitative test results, not simultaneous multi-parameter measurement results, etc., and achieve high-throughput fully automatic detection and modulation range. Wide, high-resolution effects

Active Publication Date: 2009-09-02
INST OF ELECTRONICS CHINESE ACAD OF SCI
View PDF3 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0002] At present, surface plasmon resonance (SPR) testers at home and abroad are usually one channel, and only one parameter is tested at a time. Multi-channel surface plasmon resonance (SPR) testers (currently reported that BiaCore products have at most four channels, according to literature reports There are 9-channel systems), each channel only measures one parameter, and does not give the measurement results of multiple parameters at the same time. Recently, an arrayed surface plasmon resonance (SPR) chip has appeared, but the test results are only qualitative results, and have not yet been given. Multiparameter Quantitative Test Results

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • High flux multiparameter imaging surface plasma resonance test instrument
  • High flux multiparameter imaging surface plasma resonance test instrument
  • High flux multiparameter imaging surface plasma resonance test instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0021] like figure 1 As shown, it is a schematic diagram of the synchronous scanning structure of the vertical rhombic lever of the present invention, which is based on the patent authorized by the inventor: ZL. The mechanical scanning structure is adopted, but the original horizontal structure is changed to a vertical structure.

[0022] The vertical diamond-shaped lever synchronous scanning structure of the present invention includes a tester base 1, an optical platform 2, a connecting rod group 3, a slider 4, a guide rail 5, a screw 6, a motor 7, a sensor 8, a light source 9, and a CCD image acquisition device 10 and optical prism 11. Plate tester base 1 is arranged vertically, and optical table 2 is fixed horizontally on the upper end of its side, and equilateral triangle optical prism 11 is fixedly arranged on the side of optical table 2, and its corner is vertically downward, on the vertical central axis. The connecting rod group 3 includes four equal-length arms, and ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The present invention is one kind of high flux multiparameter image surface plasma resonance test instrument, and relates to detection technology. The test instrument in synchronous scanning structure has a triangular optical prism, an array surface plasma resonance chip, a micro measuring pond with at least one flow channel, an automatic sampling system communicated with the micro measuring pond, an optical system, a mechanical scanning system, a data acquiring system, an embedded microprocessor, and a computer with information acquiring and processing software and system operating software for controlling the test instrument. It operates in one of three operation modes to complete quantitative high flux multiparameter detection.

Description

technical field [0001] The invention relates to the technical field of detection, and is a novel high-throughput, multi-parameter, and image Surface Plasmon Resonance (SPR) tester. Background technique [0002] At present, surface plasmon resonance (SPR) testers at home and abroad are usually one channel, and only one parameter is tested at a time. Multi-channel surface plasmon resonance (SPR) testers (currently reported that BiaCore products have at most four channels, according to literature reports There are 9-channel systems), and each channel only measures one parameter, and does not give the measurement results of multiple parameters at the same time. Recently, an arrayed surface plasmon resonance (SPR) chip has appeared, but the test results are only qualitative results, and have not yet been given. Multiparameter Quantitative Test Results. Contents of the invention [0003] The invention proposes a novel high-throughput multi-parameter image surface plasmon resona...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01N21/55
Inventor 崔大付蔡浩原王军波李亚亭梁金庆刘长春王于杰郑自攀
Owner INST OF ELECTRONICS CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com