Lithographic apparatus and device manufacturing method
A component and encoder technology, applied in microlithography exposure equipment, semiconductor/solid-state device manufacturing, optomechanical equipment, etc., can solve problems such as deformation, measurement error, long control stabilization time, and non-monolithic objects
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[0021] Fig. 1 schematically depicts a lithographic apparatus according to an embodiment of the present invention. The apparatus comprises an illumination system (illuminator) IL configured to condition a radiation beam B (e.g. UV radiation or any other suitable radiation) and a mask support structure (e.g. a mask table) MT, the mask The support structure MT is used to support the patterning device (eg mask) MA and is connected to a first positioning device PM configured to accurately position the patterning device according to certain parameters. The apparatus also includes a substrate table (e.g., wafer table) WT or "substrate support" for supporting a substrate (e.g., a photoresist-coated wafer) W and configured to accurately position the substrate according to certain parameters. The second positioning device PW is connected. The apparatus also comprises a projection system (eg a refractive projection lens system) PL for projecting a pattern imparted to the radiation beam ...
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Abstract
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