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Method for detecting solar cell leakage current by infrared thermal imager

An infrared thermal imager and solar cell technology, applied in the field of solar photovoltaics, can solve problems such as incomplete removal of edge junctions, cracks, too small parallel resistance of solar cells, etc., and achieve the effect of improving solar cell performance and simple structural layout

Inactive Publication Date: 2009-05-20
SUN YAT SEN UNIV
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  • Summary
  • Abstract
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Problems solved by technology

There are many reasons for the decrease in the parallel resistance of solar cells: 1. The quality of solar cell raw materials is not high, such as composite centers caused by material defects; Completely, etc.; 3 Improper use of solar cells, such as cracks caused by stress, etc.
At present, the photovoltaic industry mainly adopts the solar cell I-V curve and the measured parallel resistance value to evaluate the parallel resistance as a whole. However, it is difficult to judge which part of the solar cell has a parallel resistance value that is too small to conduct a detailed analysis of the solar cell.

Method used

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Embodiment Construction

[0020] The specific steps of the method for detecting the leakage current of a solar cell using an infrared thermal imager provided in an embodiment of the present invention are as follows:

[0021] (1) Place the completed solar cell in a dark room, the back of the solar cell is in close contact with the stage with good heat dissipation, the positive and negative electrodes of the solar cell are connected to the regulated power supply, and the infrared thermal imager is aligned Light-receiving surface of solar cell;

[0022] (2) Use a regulated power supply to apply a positive or negative bias to the solar cell, and then observe the infrared thermal image;

[0023] (3) Judging that the high-temperature area shown in the infrared thermal image is the leakage area;

[0024] (4) According to the location of the leakage area and the form of expression under positive and negative bias voltages, the cause of the leakage is speculated.

[0025] As an extension of the method of the ...

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Abstract

The invention discloses a method for detecting leakage current of a solar battery by an infrared thermal imager. The method comprises the following steps: 1, a prepared solar battery plate is placed into a dark room, the back face of the solar battery is closely contacted with an objective table with good heat dissipation, the anode and cathode of the solar battery are connected with a constant voltage power supply, and the infrared thermal imager faces the light receiving face of the solar battery; 2, the solar battery is loaded with positive bias or negative bias by the constant voltage power supply, and an infrared thermal image is observed; 3, according to the display of the infrared thermal image, an obvious high-temperature zone, compared with nearby zones, is judged to be an electrical leakage zone; and 4, according to the position of the electrical leakage zone and performances of the electrical leakage zone under the positive bias and negative bias, the cause of the electric leakage is predicted. The method has the advantages of few necessary instruments, simple structure, quickness and convenience; and by adopting the method, the position of the leakage current of the solar battery can be quickly detected, the cause of the leakage current can be conveniently analyzed, so that the method provides the guiding action for the performance enhancing of the solar battery.

Description

technical field [0001] The invention belongs to the field of solar photovoltaics, and in particular relates to a method for detecting leakage current of a solar cell. Background technique [0002] Improving the efficiency of solar cells has been the direction of efforts in the field of solar photovoltaics. Parallel resistance is an important parameter to reflect the electrical performance of solar cells, the larger the parallel resistance, the better. There are many reasons for the decrease in the parallel resistance of solar cells: 1. The quality of solar cell raw materials is not high, such as composite centers caused by material defects; Completely, etc.; 3 Improper use of solar cells, such as cracks caused by stress. At present, the photovoltaic industry mainly adopts the solar cell I-V curve and the measured parallel resistance value to evaluate the parallel resistance as a whole. However, it is difficult to judge which part of the solar cell has a parallel resistance...

Claims

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Application Information

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IPC IPC(8): G01R31/26G01R31/02
Inventor 舒碧芬金井升张陆成沈辉陈美园
Owner SUN YAT SEN UNIV
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