Test data generation method and test system

A test system and test data technology, applied in the direction of digital transmission system, software testing/debugging, transmission system, etc., can solve the problem of high complexity of script writing, reduce the workload of script maintenance, improve efficiency, and simplify the difficulty of script writing Effect

Active Publication Date: 2010-07-07
ZTE CORP
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] The technical problem to be solved by the present invention is to provide a test data generation method and a test system to overcome the defects of high script writing complexity in the prior art

Method used

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  • Test data generation method and test system
  • Test data generation method and test system
  • Test data generation method and test system

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Embodiment Construction

[0026] The technical solution of the present invention will be described in more detail below with reference to the drawings and embodiments.

[0027] The basic concept of the method of the present invention is: the test system generates a test script containing the attribute parameters of the involved basic elements by loading the basic elements that constitute the test equipment and the equipment under test included in the test environment topology selected by the user; wherein, the test The environment topology includes the device under test and the test device selected by the user, and the test device and the device under test are composed of basic components stored in the test system, and each basic component is configured with attribute parameters.

[0028] Specifically, the method of the present invention includes the following steps:

[0029] Step 1: Carry out functional abstract decomposition of the equipment under test and the test equipment respectively to obtain th...

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PUM

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Abstract

The invention discloses a test data generation method and test system. The method comprises the following step: the test system loads basic elements, of the test device and a device to be tested, contained in testing environment topology selected by a user to generate a test script containing the attribute parameter of the related basic elements, wherein the testing environment topology contain the device to be tested and the test device, the test device and device to be tested are both composed of the basic elements stored in the test system and the attribute parameter is configured in each basic element. The system comprises a testing environment topology unit, a man-machine interaction unit and a test parameter generation unit. Compared with the prior art, the invention can realize theseparation of test data and test logic, automatically generate test data and realize the reuse of test data so as to simplify script-writing difficulty, reduce the work load of script maintenance andincrease the efficiency of automated test.

Description

technical field [0001] The invention relates to the field of communication equipment testing, in particular to a test data generation method and a test system. Background technique [0002] In the testing process of communication equipment, in order to verify the stability of a certain function of the equipment, testers will artificially build various test environments to simulate the actual working environment of the equipment. Therefore, in the process of automated testing, when developers write test scripts, they usually write test scripts according to test procedures, then manually analyze the test content, and finally define some variable parameters as variables to form a test data configuration file, configure these parameters before the script is executed, so as to achieve the purpose of running the same script in different test environments. [0003] Judging from the currently disclosed technologies, they are all implemented in the above similar manner. For example,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36H04L12/26
Inventor 王志鹏
Owner ZTE CORP
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