Capacitor measurement device and method thereof

A technology of capacitance measurement and capacitance, which is applied in the field of fast and accurate measurement of capacitance and fast measurement of large capacitance. It can solve the problems of long measurement time and the influence of capacitors on measurement accuracy, etc., and achieve accurate calculation results, fast automatic range selection, and fast expansion. The effect of the range of measurements

Inactive Publication Date: 2010-08-11
臧佳菁
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Problems solved by technology

Current capacitance measurement techniques are unsatisfactory, not only due to the long measurement time required to wai

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  • Capacitor measurement device and method thereof
  • Capacitor measurement device and method thereof
  • Capacitor measurement device and method thereof

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Embodiment Construction

[0042] The invention will be further described in detail below in conjunction with the accompanying drawings as an example. see figure 1 , the figure mainly includes positive and negative constant current sources I+ and I- whose constant current value and direction can be changed selectively; low-noise amplifier A1 whose gain can be changed selectively; fast analog / digital converter AD1; four-threshold digital comparator ; Microprocessor μP and display. And the sampling resistor R0 and the analog / digital converter AD2.

[0043] see figure 2 , a typical waveform diagram of an ideal (no absorption effect) capacitor when it is charged and discharged with a positive and negative constant current source, V1 is the discharge threshold, and V2 is the charge threshold. Assume that the capacitor has no absorbing effect. It can be seen that the voltage on the capacitor changes completely linearly between the charge and discharge thresholds V1 and V2, such as the time from V1 to V2 ...

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Abstract

The invention relates to capacitor measurement device and method thereof. The device comprises a four-threshold digital comparator, a variable gain amplifier, a size variable positive and negative constant flow source, a rapid analog/digital converter, a microprocessor and a display, wherein the microprocessor receives output signals of the four-threshold digital comparator and the analog/digitalconverter and outputs measurement results to the display; the microprocessor selects the positive and negative constant flow source and the amplification factor of the amplifier according to the capacity of a measured capacitor; and voltage on the measured capacitor amplified by the variable gain amplifier is measured by the rapid analog/digital converter, and the measurement results are output to the four-threshold digital comparator. In the capacitor measurement method, by the constant flow forward charge and back discharge of the measured capacitor, the microprocessor figures out the measurement result of a primary capacitance value according to time interval of the forward charge and back discharge between two threshold values preset by the four-threshold digital comparator, the numerical value of the constant flow source and the amplification factor of the variable gain amplifier. The invention greatly reduces the measurement time of the capacitor under the condition of using smaller charge/discharge current and eliminates the influence of the absorption effect of the capacitor on the measurement accuracy by the installation of the four-threshold digital comparator.

Description

technical field [0001] The invention relates to a device and method for measuring capacitance, in particular to provide a method and device suitable for fast and accurate measurement of capacitance, especially for fast measurement of large capacitance. The method and device for measuring capacitance of the present invention can also effectively avoid the influence of capacitance absorption effect. Background technique [0002] Capacitance measurement has become an important feature of measuring instruments such as digital multimeters. Current capacitance measurement techniques are unsatisfactory not only because of the long measurement time required to wait for the unknown capacitor to charge, but also because of the absorption effect of the capacitor affecting measurement accuracy. It is desirable to provide a new measurement method, expand the larger measurement range of capacitance and realize fast and accurate measurement. [0003] It is well known that the current i f...

Claims

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Application Information

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IPC IPC(8): G01R27/26G01R31/00
Inventor 臧佳菁臧玉伦
Owner 臧佳菁
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