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Aging test method

An aging test and anti-aging technology, which is applied in the direction of measuring electricity, measuring devices, and measuring electrical variables, etc., can solve the problems of single function, high cost, and expensive transfer of aging test methods, and achieve good test systems, stable connections, and improved The effect of traceability

Inactive Publication Date: 2011-07-20
苏州凌创科技发展有限公司
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Problems solved by technology

[0003] Based on the long-term investigation in this field, we found that most of the aging test methods of various ECUs and related electronic components in the domestic auto industry have been owned by foreign suppliers for a long time, but due to the expensive transfer of foreign aging test methods , single function, lagging after-sales service and high cost

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Embodiment Construction

[0012] The preferred embodiments of the present invention are described in detail below, so that the advantages and features of the present invention can be more easily understood by those skilled in the art, so as to define the protection scope of the present invention more clearly.

[0013] See attached figure 1 , the implementation architecture diagram of this aging test method, the following is a study on the entire architecture:

[0014] 1. Improve the aging resistance and corrosion resistance of the mechanical structure used in the aging test method. The mechanical structure in the aging test is often used alternately between high temperature, high humidity and low temperature, and works at high temperature or low temperature for a long time. Therefore, the corresponding mechanical structure must be stable, so that the size of the mechanical deformation at high and low temperatures must be guaranteed to be within the range specified by the test product. According to ind...

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Abstract

The invention provides an aging test method. An anti-aging and anticorrosive mechanical structure, a PCI extension for Instrumentation (PXI) bus architecture, LabVIEW and TestStand platforms, a high-speed controller area network (CAN) card, a simulation acquisition card, an international general virtual path connector (VPC) and a data uploading system are adopted for implementing the method. The invention solves the barriers of the conventional foreign technology, and provides the aging test method with stable performance, strong function, high integration, low cost and flexible compatibility.

Description

technical field [0001] The invention relates to an aging test method. Background technique [0002] With the explosive growth of my country's auto industry, the aging test method, which is an indispensable step in the production process of auto parts, is becoming more and more important. The aging test is divided into component aging and complete machine aging. Especially for newly developed products, it is necessary to test new components or new machine performance, and the aging test index is higher. Aging causes product defects to be exposed on the production line, such as the reliability of solder joints and components. Products may have various defects or defects in design, material and process. Aging test is an effective means to find these problems. Aging test makes the product performance enter the stable range before leaving the factory, reducing the repair rate. This is the necessity of aging test. Because of its impact on production capacity and product qualit...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/00
Inventor 马雷
Owner 苏州凌创科技发展有限公司
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