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Solid-state imaging device

A solid-state imaging device and image technology, which can be used in electrical solid-state devices, image communications, semiconductor devices, etc., and can solve problems such as inability to correct the offset and deformation of projected images.

Inactive Publication Date: 2011-09-28
KK TOSHIBA
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] In this method, although the shape deformation of the projected image projected from the projector can be visually recognized, the shift, deformation, etc. of the projected image projected from the projector cannot be corrected

Method used

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Experimental program
Comparison scheme
Effect test

no. 1 approach

[0031] figure 1 It is a block diagram showing a schematic configuration of the solid-state imaging device according to the first embodiment of the present invention.

[0032] exist figure 1 Among them, the solid-state imaging device 1 is provided with: an image sensor 2, a timing signal generation circuit 3, an A / D converter 4, a signal processing circuit 5, an image position correction circuit 6, an image signal interface circuit 7, a register interface 8, and a correction circuit. Parameter register 9.

[0033] Here, the image sensor 2 is capable of imaging, and includes a pixel array unit in which pixels are arranged in a matrix. The timing signal generation circuit 3 can generate timing signals so that the image sensor 2 , the A / D converter 4 , the signal processing circuit 5 , the image position correction circuit 6 , and the video signal interface circuit 7 can operate in cooperation. The A / D converter 4 can digitize the imaging signal output from the image sensor 2 ....

no. 2 approach

[0120] Figure 14 is a cross-sectional view showing a schematic configuration of a solid-state imaging device according to a second embodiment of the present invention.

[0121] exist Figure 14 In this embodiment, an image sensor 2 is formed on a semiconductor chip 101 , and an attenuation electrode (pad electrode) 103 is formed around the semiconductor chip 101 . In addition, it is also possible to form on the semiconductor chip 101 figure 1 Timing signal generation circuit 3, A / D converter 4, signal processing circuit 5, image position correction circuit 6, signal interface circuit 7, register interface 8 and correction parameter register 9.

[0122]On the other hand, land electrodes 105 are formed on the motherboard 104 . In addition, the semiconductor chip 101 is mounted on the mother substrate 104 , and the attenuation electrode 103 and the protruding electrode 105 are connected by bonding wires 106 . In addition, a lens barrel 107 is arranged on the motherboard 104 ...

no. 3 approach

[0125] Figure 15 It is a block diagram showing a schematic configuration of a solid-state imaging device according to a third embodiment of the present invention.

[0126] exist Figure 15 Among them, on the solid-state imaging device 21a, an image sensor 22a, a timing signal generating circuit 23a, an A / D converter 24a, a signal processing circuit 25a, an image position correction circuit 26a, an image signal interface circuit 27a, a register interface 28a and Calibration parameter register 29a. In addition, a coordinate conversion unit 30a is provided on the image position correction circuit 26a. Here, a lens 31a is arranged in front of the image sensor 22a.

[0127] On the solid-state imaging device 21b, an image sensor 22b, a timing signal generation circuit 23b, an A / D converter 24b, a signal processing circuit 25b, an image position correction circuit 26b, an image signal interface circuit 27b, a register interface 28b, and correction parameters are provided. Regist...

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PUM

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Abstract

According to one embodiment, a correction-parameter storing unit (9) corrects a position of a captured image captured by an image sensor, and an image-position correcting unit (6) corrects the position of the captured image for each pixel based on the correction parameter.

Description

[0001] This application is based upon and claims the benefit of priority from Japanese Patent Application No. 2010-69345 filed March 25, 2010, the entire contents of which are incorporated herein by reference. technical field [0002] This embodiment generally relates to a solid-state imaging device. Background technique [0003] In a solid-state imaging device, an image sensor and a lens are integrated by fixing a lens to a lens barrel on which the image sensor is disposed and modularizing the image sensor and the lens. [0004] In this method, when the image sensor and the lens are modularized, due to manufacturing deviation of the lens or the lens barrel, deformation of the lens, or deviation of the mounting position of the lens, etc., there may be problems on the image output from the solid-state imaging device. deflection or deformation etc. [0005] In addition, in order to visually and quantitatively recognize the shape distortion of the projected image projected fro...

Claims

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Application Information

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IPC IPC(8): H04N17/00
CPCH04N5/3572H01L27/14618H01L27/14625H04N25/61
Inventor 日高喜代志
Owner KK TOSHIBA