Real-time synchronous measuring instrument and method of spectrum response of photovoltaic material

A technology of spectral response and measuring device, which is applied in the field of real-time synchronous measuring device for spectral response of photovoltaic materials, can solve the problems of not real-time, data error, and inability to measure the absolute spectral response curve, etc., to achieve the effect of wide application and synchronization

Inactive Publication Date: 2011-11-23
SHANDONG UNIV
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Problems solved by technology

There is a big defect in this method, that is, it does not collect data in real time, and the standard silicon photovoltaic cell and the silicon photovoltaic cell to be tested do not receive sunlight at the same time, so there are errors in the collected data, and this method Absolute spectral response curves cannot be measured

Method used

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  • Real-time synchronous measuring instrument and method of spectrum response of photovoltaic material
  • Real-time synchronous measuring instrument and method of spectrum response of photovoltaic material
  • Real-time synchronous measuring instrument and method of spectrum response of photovoltaic material

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Embodiment

[0016] A real-time simultaneous measurement device and measurement method for the spectral response of photovoltaic materials, such as figure 1 and figure 2 shown. The measurement device includes a computer (1) with LabVIEW software installed, a PXI platform, a monochromator with a stepping motor, a TS1339r illuminance meter, a PXI6534 data acquisition card and a PXI4072 data acquisition card; The acquisition card and PXI4072 data acquisition card are installed on the PXI platform, the monochromator is connected with the PXI6534 data acquisition card, and the PXI4072 data acquisition card is connected with the silicon photocell.

[0017] Described LabVIEW software, PXI platform, PXI6534 data acquisition card and PXI4072 data acquisition card are products of National Instruments, and PXI4072 data acquisition card is a six and a half digital multimeter.

[0018] The model of the monochromator mentioned is WDS-3C.

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Abstract

The invention discloses a real-time synchronous measuring instrument and method of spectrum response of a photovoltaic material, belonging to the technical field of measurement. The real-time synchronous measuring instrument of spectrum response of the photovoltaic material comprises a computer with software, a PXI (PCI eXtensions for instrumentation) platform, a monochromator provided with a stepping motor, an illuminometer, a PXI6534 data acquisition card and a PXI4072 data acquisition card, wherein the PXI platform and the illuminometer are connected with the computer, the PXI6534 data acquisition card and the PXI4072 data acquisition card are arranged on the PXI platform, the monochromator is connected with the PXI6534 data acquisition card, and the PXI4072 data acquisition card is connected with a silicon photocell. During the measurement, a light source mercury lamp and a sodium lamp with known spectrum are used, the step number of the stepping motor is recorded when the monochromator separates out light with specific wavelength, and then a calibration curve of the wavelength and the step number of the stepping motor is drawn by utilizing a polynomial fitting method; and when a xenon lamp is used instead of the mercury lamp and the sodium lamp, the stepping motor rotates, a program obtains the congruent relationship between the corresponding spectrum line and the wavelength according to the calibration curve, the PXI4072 data acquisition card acquires the real-time short circuit current, the illuminometer collects the information of irradiance, and a triggering signal is used for controlling the xenon lamp to be turned on and the short circuit current and the irradiance to be acquired highly synchronously.

Description

technical field [0001] The invention relates to a real-time and synchronous measurement device and measurement method for the spectral response of photovoltaic materials, belonging to the technical field of photovoltaic material testing. Background technique [0002] At present, the measurement method of the spectral response curve of silicon photovoltaic cells is mainly the single-light path method, that is, using a monochromator to split the light, so that the monochromatic light is respectively irradiated on the standard silicon photovoltaic cell and the silicon photovoltaic cell to be tested, and the relative spectral response is finally drawn by using the results to do business. curve. There is a big defect in this method, that is, it does not collect data in real time, and the standard silicon photovoltaic cell and the silicon photovoltaic cell to be tested do not receive sunlight at the same time, so there are errors in the collected data, and this method Absolute sp...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/26H02S50/15
CPCY02E10/50
Inventor 李茂奎王震罗路
Owner SHANDONG UNIV
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