Energy method-based high-temperature radiation rate measuring device of semi-transparent material and revising method for deducting background radiation

A translucent material and high-temperature radiation technology, which is applied in measuring devices, optical radiation measurement, radiation pyrometry, etc., can solve problems such as low temperature limit, large background radiation noise, and low measurement accuracy of emissivity measurement technology

Active Publication Date: 2012-07-11
HARBIN INST OF TECH
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The present invention aims to solve the problems of large background radiation noise, low emissivity measurement technology measurement accuracy and low temperature upper limit due to the translucent charact...

Method used

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  • Energy method-based high-temperature radiation rate measuring device of semi-transparent material and revising method for deducting background radiation
  • Energy method-based high-temperature radiation rate measuring device of semi-transparent material and revising method for deducting background radiation
  • Energy method-based high-temperature radiation rate measuring device of semi-transparent material and revising method for deducting background radiation

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specific Embodiment approach 1

[0075] Specific implementation mode one: the following combination figure 1 This embodiment will be described.

[0076] A device for measuring high-temperature emissivity of translucent materials based on an energy method, characterized in that it includes a Fourier infrared spectrum analyzer 1, a reference blackbody furnace 2, a rotatable mirror 3, a heating furnace 4, a heater 5, and a temperature acquisition device 6. Temperature inspection controller 7, incident light source 8, data processing system 9 and aperture 10;

[0077] Described heating furnace 4 is built-in light-transmitting port 12, the fixing device 14 of translucent test piece and the temperature collecting device 6; Light-transmitting port 12; the temperature signal output end of the temperature acquisition device 6 is connected to the temperature signal input end of the temperature inspection control instrument 7, and the output end of the temperature control signal of the temperature inspection control in...

specific Embodiment approach 2

[0105] Specific implementation mode two: a correction method for subtracting background radiation of a translucent material high-temperature emissivity measuring device based on an energy method, characterized in that the steps of realization are:

[0106] Step 1. Start the reference blackbody furnace 2, and adjust the collimation of the optical path, measure the spectral radiation signal distribution of the reference blackbody furnace 2 at two different temperatures, and then determine the Fourier infrared spectrum analyzer according to the ambient radiation compensation algorithm for removing background noise. The response function between the input signal and the output signal of 1; the specific method is:

[0107] The expression of the radiation signal measurement output of the Fourier infrared spectrometer 1 at the wavelength λ is:

[0108] S ( λ ) ...

specific Embodiment approach 3

[0158] Specific Embodiment Three: This embodiment is a further description of Embodiment Two.

[0159] A correction method for subtracting background radiation of a translucent material high-temperature emissivity measuring device based on an energy method. The size of the translucent test piece 11 is: the diameter of the circular test piece is 25-100mm, and the side length of the rectangular test piece is 25-100mm.

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Abstract

The invention provides an energy method-based high-temperature radiation rate measuring device of a semi-transparent material and a revising method for deducting background radiation, relating to a high-temperature normal spectral radiation rate revising and testing method of the semi-transparent material and belonging to the technical field of high-temperature material physical property measurement. The energy method-based high-temperature radiation rate measuring device of the semi-transparent material and the revising method for deducting the background radiation solve the problems of high construction cost, low temperature heating upper limit and lower testing precision of the traditional test system. The high-temperature radiation rate measuring device comprises a Fourier infrared spectrum analyzer, a reference blackbody furnace, a rotatable reflection mirror, a heating furnace, a heater, a temperature collecting device, a temperature routing inspection operation instrument, an incidence light source, a data processing system, a diaphragm and a semi-transparent test piece; the heating furnace is internally provided with a light-transmitting opening, a fixing device of the semi-transparent test piece, and the temperature collecting device; the central axis of a light-emitting opening of the incidence light source, the central axis of the light-transmitting opening of the heating furnace, the mirror surface of the rotatable reflection mirror and the central axis of the light outlet opening of the reference blackbody furnace are collinear with a horizontal axis. The energy method-based high-temperature radiation rate measuring device of the semi-transparent material and the revising method for deducting the background radiation, disclosed by the invention, are used for measuring the high-temperature spectral normal radiation rate of the surface of the semi-transparent material.

Description

technical field [0001] The invention relates to a high-temperature normal spectral radiance measuring device for translucent materials and a correction test method thereof, belonging to the technical field of high-temperature measurement of material properties. Background technique [0002] Emissivity is defined as the ratio of the surface radiant energy of a material to the radiant energy of a black body at the same temperature. The emissivity of the surface of various materials is a physical quantity that characterizes the radiation ability of the surface of the material, and is an extremely important thermophysical parameter. plays an important role in many fields. However, since the emissivity of the material surface is not an intrinsic parameter of the material, it is not only related to the material composition, but also related to the surface condition (roughness) of the material, and also related to factors such as the temperature of the material and the investigate...

Claims

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Application Information

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IPC IPC(8): G01J5/52G01J5/06G01N25/00
Inventor 王大林齐宏阮立明牛春洋谈和平
Owner HARBIN INST OF TECH
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