Energy method-based high-temperature radiation rate measuring device of semi-transparent material and revising method for deducting background radiation

Abstract

The invention provides an energy method-based high-temperature radiation rate measuring device of a semi-transparent material and a revising method for deducting background radiation, relating to a high-temperature normal spectral radiation rate revising and testing method of the semi-transparent material and belonging to the technical field of high-temperature material physical property measurement. The energy method-based high-temperature radiation rate measuring device of the semi-transparent material and the revising method for deducting the background radiation solve the problems of high construction cost, low temperature heating upper limit and lower testing precision of the traditional test system. The high-temperature radiation rate measuring device comprises a Fourier infrared spectrum analyzer, a reference blackbody furnace, a rotatable reflection mirror, a heating furnace, a heater, a temperature collecting device, a temperature routing inspection operation instrument, an incidence light source, a data processing system, a diaphragm and a semi-transparent test piece; the heating furnace is internally provided with a light-transmitting opening, a fixing device of the semi-transparent test piece, and the temperature collecting device; the central axis of a light-emitting opening of the incidence light source, the central axis of the light-transmitting opening of the heating furnace, the mirror surface of the rotatable reflection mirror and the central axis of the light outlet opening of the reference blackbody furnace are collinear with a horizontal axis. The energy method-based high-temperature radiation rate measuring device of the semi-transparent material and the revising method for deducting the background radiation, disclosed by the invention, are used for measuring the high-temperature spectral normal radiation rate of the surface of the semi-transparent material.

Description

technical field [0001] The invention relates to a high-temperature normal spectral radiance measuring device for translucent materials and a correction test method thereof, belonging to the technical field of high-temperature measurement of material properties. Background technique [0002] Emissivity is defined as the ratio of the surface radiant energy of a material to the radiant energy of a black body at the same temperature. The emissivity of the surface of various materials is a physical quantity that characterizes the radiation ability of the surface of the material, and is an extremely important thermophysical parameter. plays an important role in many fields. However, since the emissivity of the material surface is not an intrinsic parameter of the material, it is not only related to the material composition, but also related to the surface condition (roughness) of the material, and also related to factors such as the temperature of the material and the investigate...

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Problems solved by technology

[0005] The present invention aims to solve the problems of large background radiation noise, low emissivity measurement technology measurement accuracy and low temperature upper limit due to the translucent characteristics of the translucent material itself, thus proposing a high-temperature emissivity measurement of translucent materials based on the energy method Device and Correction Method for Subtracting Background Radiation

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