Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

An image stitching processing system

A processing system and image stitching technology, applied in the field of image processing, can solve the problem of not being able to eliminate seams in structure and color at the same time

Active Publication Date: 2016-01-20
南京多目智能科技有限公司
View PDF3 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] In view of this, the present invention provides an image mosaic processing system to solve the problem that the existing algorithm cannot simultaneously eliminate the seams in structure and color

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • An image stitching processing system
  • An image stitching processing system
  • An image stitching processing system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0107] The flow of image splicing processing disclosed in this embodiment is as follows: Image 6 shown, including:

[0108] Step S1, reading two adjacent images in the image sequence;

[0109] Read two adjacent images from the image sequence I s (x) and I t (x), consisting of three color components of R, G, and B, whose height is N h pixels, width N w pixels, x represents the coordinates of the two-dimensional space, which can be represented by a vector (m,n), where 0≤m≤N h -1, 0≤n≤N w -1,, m, n, N h , N w are non-negative integers.

[0110] Step S2, determine image I s (x) and image I t (x) overlapping region; Utilize SIFT operator to image I s (x) and image I t (x) extracting and matching feature points, calculating space transformation parameters according to the matching feature points, thereby obtaining the image I s (x) and image I t the overlapping area of ​​(x);

[0111] If for the above image I s (x) and image I t (x) Splicing directly according to t...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an image stitching processing system, which belongs to the field of image processing, and is characterized in that an image reading unit, an overlapping region unit, a preprocessing unit, an optimal stitching line unit, a feature location unit, a feature matching unit, and a deformation propagation and image reconstruction unit are arranged in a digital processing circuit, wherein the image reading unit is used for reading two adjacent images from an image sequence; the overlapping region unit is used for acquiring an overlapping region of the two images; the preprocessing unit is used for preprocessing color of the overlapping region; the optimal stitching line unit is used for obtaining an optimal stitching line in the overlapping region; the feature location unit is used for detecting feature points in an optimal stitching line neighbourhood; the feature matching unit is used for matching the detected feature points; and the deformation propagation and image reconstruction unit is used for obtaining a deformation vector of each pixel point of each image, obtaining a gradient field of each image, and reconstructing a stitched image according to the gradient field. According to the image stitching processing system, the optimal stitching line is used as the most important image feature, so that the limitation of a shape of the overlapping region is solved, a lapped seam can be well eliminated in color and structure, and a real-time processing requirement can be met by utilizing an acceleration algorithm.

Description

technical field [0001] The present invention relates to the field of image processing, and more specifically, to an image splicing processing system. Background technique [0002] Image stitching is a research hotspot in the field of computer vision in recent years. It is widely used in satellite and aerial photos, expanding camera resolution and field of view, video compression and retrieval, and image restoration. The purpose of image stitching is to form a visually acceptable panoramic image, that is, it is required that the structure and color of the image can transition naturally at the stitching point. Image stitching is mainly composed of image registration and image fusion. Image registration mainly includes region-based registration and feature-based registration. Image fusion mainly eliminates stitching seams from two aspects of structure and color. [0003] There are two main types of image registration methods based on region and feature. The region-based regis...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G06T5/50G06T3/40
Inventor 卞春晓肖创柏邓米克郗慧琴
Owner 南京多目智能科技有限公司
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com