TeraHertz-wave far-field detection super-diffraction resolution imaging instrument

A terahertz and super-diffraction technology, applied in the field of terahertz spectral imaging, can solve the problems of poor universality, complex system structure, limited application scope of super-diffraction-resolution terahertz imaging technology, etc., and achieve the effect of wide application field and accurate imaging

Inactive Publication Date: 2015-05-27
INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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Problems solved by technology

However, since near-field imaging requires the measured sample to be close to the probe, the system structure is complex and the universality is poor, which largely limits the application range of super-diffraction-resolved terahertz imaging technology.
The terahertz wave far-field detection and imaging technology that can achieve micron-level imaging resolution has not been solved

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[0033] All features disclosed in this specification, or steps in all methods or processes disclosed, may be combined in any manner, except for mutually exclusive features and / or steps.

[0034] Any feature disclosed in this specification (including any appended claims, abstract and drawings), unless expressly stated otherwise, may be replaced by alternative features which are equivalent or serve a similar purpose. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.

[0035] 1. Relevant descriptions of the present invention:

[0036] 1. The working principle of this device:

[0037] 1) The basic principle of terahertz imaging: use the terahertz imaging system to process and analyze the information of the transmission spectrum or reflection spectrum of the imaged sample (including the binary information of amplitude and phase), and obtain the terahertz image of the sample . Compared with terahertz time-do...

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Abstract

The invention relates to the technical field of terahertz spectral imaging, in particular to a super-diffraction resolution imager for terahertz wave far-field detection. The technical problem to be solved by the present invention is to provide a super-diffraction resolution imager for terahertz wave far-field detection to improve the spatial resolution of terahertz wave far-field imaging to the micron level and improve Improve the quality of terahertz imaging and expand the application field of terahertz imaging technology. The invention includes a terahertz emitter, a laser generating device, an angle converter, an aperture imaging device, a terahertz detector, a lock-in amplifier and the like. The invention is applied in the technical field of terahertz spectral imaging.

Description

technical field [0001] The invention relates to the technical field of terahertz spectral imaging, in particular to a super-diffraction resolution imager for terahertz wave far-field detection. Background technique [0002] Terahertz waves, like electromagnetic radiation in other bands, can be used to image objects, and most substances in terahertz have fingerprints and other characteristics in the terahertz band, which makes terahertz imaging more advantageous than other imaging methods. [0003] In 1995, Hu et al. added a two-dimensional scanning translation stage to the THz-TDS system, realized pulsed THz time-domain spectral imaging for the first time, and successfully imaged samples such as leaves and chips. Because the spectral information of the measured sample obtained by this imaging method can not only realize structural imaging, but also realize functional imaging. With the in-depth understanding of the new characteristics of terahertz waves, terahertz imaging tec...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/42
Inventor 孟坤朱礼国刘乔钟森城雷江波
Owner INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
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