Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

TeraHertz-wave far-field detection super-diffraction resolution imaging instrument

A terahertz and super-diffraction technology, applied in the field of terahertz spectral imaging, can solve the problems of poor universality, complex system structure, limited application scope of super-diffraction-resolution terahertz imaging technology, etc., and achieve the effect of wide application field and accurate imaging

Inactive Publication Date: 2015-05-27
INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
View PDF3 Cites 1 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, since near-field imaging requires the measured sample to be close to the probe, the system structure is complex and the universality is poor, which largely limits the application range of super-diffraction-resolved terahertz imaging technology.
The terahertz wave far-field detection and imaging technology that can achieve micron-level imaging resolution has not been solved

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • TeraHertz-wave far-field detection super-diffraction resolution imaging instrument
  • TeraHertz-wave far-field detection super-diffraction resolution imaging instrument
  • TeraHertz-wave far-field detection super-diffraction resolution imaging instrument

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0033] All features disclosed in this specification, or steps in all methods or processes disclosed, may be combined in any manner, except for mutually exclusive features and / or steps.

[0034] Any feature disclosed in this specification (including any appended claims, abstract and drawings), unless expressly stated otherwise, may be replaced by alternative features which are equivalent or serve a similar purpose. That is, unless expressly stated otherwise, each feature is one example only of a series of equivalent or similar features.

[0035] 1. Relevant descriptions of the present invention:

[0036] 1. The working principle of this device:

[0037] 1) The basic principle of terahertz imaging: use the terahertz imaging system to process and analyze the information of the transmission spectrum or reflection spectrum of the imaged sample (including the binary information of amplitude and phase), and obtain the terahertz image of the sample . Compared with terahertz time-do...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to the technical field of terahertz spectral imaging, in particular to a super-diffraction resolution imager for terahertz wave far-field detection. The technical problem to be solved by the present invention is to provide a super-diffraction resolution imager for terahertz wave far-field detection to improve the spatial resolution of terahertz wave far-field imaging to the micron level and improve Improve the quality of terahertz imaging and expand the application field of terahertz imaging technology. The invention includes a terahertz emitter, a laser generating device, an angle converter, an aperture imaging device, a terahertz detector, a lock-in amplifier and the like. The invention is applied in the technical field of terahertz spectral imaging.

Description

technical field [0001] The invention relates to the technical field of terahertz spectral imaging, in particular to a super-diffraction resolution imager for terahertz wave far-field detection. Background technique [0002] Terahertz waves, like electromagnetic radiation in other bands, can be used to image objects, and most substances in terahertz have fingerprints and other characteristics in the terahertz band, which makes terahertz imaging more advantageous than other imaging methods. [0003] In 1995, Hu et al. added a two-dimensional scanning translation stage to the THz-TDS system, realized pulsed THz time-domain spectral imaging for the first time, and successfully imaged samples such as leaves and chips. Because the spectral information of the measured sample obtained by this imaging method can not only realize structural imaging, but also realize functional imaging. With the in-depth understanding of the new characteristics of terahertz waves, terahertz imaging tec...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01J3/42
Inventor 孟坤朱礼国刘乔钟森城雷江波
Owner INST OF FLUID PHYSICS CHINA ACAD OF ENG PHYSICS
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com