Transient microscopic imaging system for diagnosing spinning and charge transport mechanism under high voltage
A technology of microscopic imaging and electric charge, applied in instruments, measuring devices, scientific instruments, etc., can solve the problems of inability to converge light beams, inability to quickly capture electron spin signals, and short working distance of high-power objective lenses.
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[0022] like figure 1As shown, it includes pulse laser generation and adjustment part I, pulse compression detection light generation and adjustment part II and detection signal collection part III, wherein pulse laser generation and adjustment part I, pulse compression detection light generation and adjustment part II and detection signal collection part Part III is placed on the same optical platform, and the multi-channel digital lock-in amplifier 31, four-channel digital oscilloscope 32 and computer 33 in the detection signal collection part III are placed outside the optical platform;
[0023] The signal output port a of the acousto-optic modulator 6 in the pulsed laser generation and adjustment part I is connected to the signal input port j of the multi-channel digital lock-in amplifier 31 in the detection signal collection III; The signal output port b of the control displacement stage 5 is connected with the signal input port m of the computer 33 in the detection signal...
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