Failure generating device used for digital protection communication test

Abstract

The invention discloses a failure generating device used for a digital protection communication test. The failure generating device is characterized in that the failure generating device comprises a control chip FPGA and three Ethernet physical layer chips 88E1111. The first Ethernet physical layer chip 88E1111 and the second Ethernet physical layer chip 88E1111 are connected with an electric interface RJ45 and an optical port module SFP respectively and different communication interfaces are selected through wire jumpers; the third Ethernet physical layer chip 88E1111 is only provided with an electric interface RJ 45 which is used as an internet access for communication between the failure generating device and a PC. The failure generating device used for the digital protection communication test breaks through the limit that at present, an RTDS can only conduct protection function testing on a digital protection device, realizes combined simulation of process layer communication failures and electric system failures and can test the functions of the digital protection device more comprehensively; due to the design of double-channel data transmission, the failure generating device can have access to a process layer network more conveniently and the failure condition of any transmission line in the process layer communication network can be simulated. In addition, the failure generating device has no influence on other communication of the process layer.

Description

technical field [0001] The invention relates to the technical field of digital substations, in particular to a device capable of determining whether a power system fails and simulating communication failures in the process layer of a digital substation so as to test the communication performance of digital protection. Background technique [0002] A significant difference between a digital substation and a traditional substation is that the way of information interaction has changed. That is, the traditional electromagnetic transformer electrical signal is replaced by the sampled value message, and the traditional switch state signal is replaced by the GOOSE message. Some faults may occur in process layer equipment such as electronic transformers, intelligent circuit breakers, merging units, and network switches during operation, resulting in errors in the sampling value messages or GOOSE messages transmitted in the network, such as frame loss and bit errors , wrong sequenc...

AI Technical Summary

Problems solved by technology

Nowadays, RTDS has been widely used in the digital protection dynamic closed-loop test system, but RTDS does not simulate the process level communication failure of the digital substation, so it cannot test the communication performance of the digital protection device

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