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Thermostat

A technology of constant temperature device and constant temperature board, which is applied in the direction of single semiconductor device testing, etc., and can solve the problems of reduced test accuracy, addition of adverse effects, and poor uniformity

Inactive Publication Date: 2017-06-06
株式会社九州日昌
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0004] However, when the LED as the test object is placed in a hot air circulation constant temperature tank, since the hot air circulating in the constant temperature tank is often directly hit the LED in order to maintain the temperature, it may have a bad influence on the test results. possibility of
In addition, the existing hot air circulation constant temperature tank has poor uniformity of temperature distribution in the tank, so when many LEDs are accommodated, the test accuracy often decreases

Method used

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Embodiment Construction

[0033] Hereinafter, embodiments of the present invention will be described based on the drawings. Such as Figure 1 to Figure 5 As shown, the constant temperature device 100 of this embodiment includes: an electric heater 11 as a heating device and a liquid passage 12 as a cooling device (refer to Figure 7 ) of the constant temperature plate 10; a plurality of test body loading stages 30 arranged on the vapor chamber 20 stacked on the constant temperature plate 10; The cover member 50 has: a partition wall member 51 having an opening 51 a surrounding the plurality of test sample mounting stages 30 ;

[0034] The cover member 50 is locked so as to be able to rise and fall through a plurality of hinges 53 arranged on the back of the constant temperature plate 10 and the vapor chamber 20 . On the front of the cover member 50 , a handle used when the cover member 50 is opened and closed is provided. Holder 54 and locking member 55 for maintaining the state when the upper surfac...

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Abstract

The invention provides a constant temperature device used for keeping and stabilizing multiple LEDs in the environment with uniform temperature in an LED temperature accelerated life test. The constant temperature device (100) comprises a constant temperature plate (10) provided with an electric heater (11) as a heating device and liquid communicating paths as cooling devices, multiple test body loading tables (30) arrayed and stacked on a uniform heating plate (20) of the constant temperature plate (10), and a cover component (50) used for covering the multiple test body loading tables (30) in an opening and closing mode. The cover component (50) is provided with a partition wall component (51) surrounding the periphery of the multiple test body loading tables (30) and provided with an opening portion (51a) and a light-transmitting top plate component (50) enclosing the position above the partition wall component (51). A cover (90) of a test body heating portion (70) used for covering the constant temperature plate (10), the test body loading tables (30), the cover component (50) and the like is installed on an outer cover (80) via hinges (91) so that a fan (92) is installed on the lower surface of a top plate portion (90a) of the cover (90).

Description

technical field [0001] The present invention relates to a constant temperature device used in temperature accelerated life tests of LEDs (Light Emitting Diodes). Background technique [0002] Although LED is a light source with a long lifespan, the current situation is that its brightness slowly decays as the lighting time increases. Therefore, the standard "IES LM-80" established by the "Illuminating Engineering Society of North America" ​​is known as one of the evaluation methods of LED lifetime. This standard tests the maintenance rate of luminance to the lighting time of the LED (luminous flux maintenance rate), and evaluates the life of the LED according to whether the test result is above a constant value. [0003] Specifically, this is for a test object LED driven at the same current value, continuously lit for 6,000 hours (250 days) under three temperature conditions of 55°C, 85°C, and an arbitrary temperature (up to 125°C) determined by the manufacturer. Time), a ...

Claims

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Application Information

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IPC IPC(8): G01R31/26
Inventor 井原努李乙松
Owner 株式会社九州日昌
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