Metallographic analysis method for gold detection

A metallographic analysis and gold technology, applied in the field of precious metal detection, can solve the problems of poor sample representation, complicated operation and high inspection cost, and achieve the effects of high accuracy, low inspection cost and large field of view.

Inactive Publication Date: 2014-12-10
NANJING INST OF PROD QUALITY INSPECTION
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  • Description
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Problems solved by technology

In the past, more mature methods for detecting gold include density method, electron probe method, X-ray fluorescence spectrometry, ICP spectrometry, fire assay gold method, etc. These methods have the advantages of wide analysis range and high precision, but they also have poor sample representativeness. , cumbersome operation, high inspection cost and other disadvantages

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  • Metallographic analysis method for gold detection

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Embodiment Construction

[0015] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0016] see figure 1 , figure 1 It is a flow chart of the metallographic analysis method for gold detection provided by the present invention.

[0017] The embodiment of the present invention provides a metallographic analysis method for gold detection, the preparation and tissue display of the gold metallographic sample. The metallographic analysis method for gold detection includes the following steps:

[0018] Flatten the metallographic sample with a flattener;

[0019] Observing the flattened metallographic sample with a metallographic microscope;

[0020] Turn on the metallographic microsco...

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Abstract

The invention provides a metallographic analysis method for the gold detection. The metallographic analysis method for the gold detection comprises the following steps: flattening a metallographic sample through a flattening machine; observing the flattened metallographic sample through a metallographic microscope; opening image pickup and analysis systems of the metallographic microscope, and collecting an image having a representative view field; and performing the color contrast treatment on metallographic structures with different characteristics, measuring the percentage of the pixel amount of a gold matrix structure, a dissimilar metal structure and the like in the whole image number by using the image analysis system according to the gray difference of different color pixels, and judging the purity of gold. The metallographic analysis method has the advantages of large view field, easiness in operation, convenience in imaging, few error factors, high accuracy, high speed, low check cost and the like, and an intuitive and reliable analysis basis can be provided for detection on the purity of the gold.

Description

technical field [0001] The invention relates to the field of precious metal detection, in particular to a metallographic analysis method for gold detection. Background technique [0002] In recent years, the phenomenon of doping iridium in gold products has appeared in the market, and a detection method that can quickly and effectively identify the purity of gold is needed. In the past, more mature methods for detecting gold include density method, electron probe method, X-ray fluorescence spectrometry, ICP spectrometry, fire assay gold method, etc. These methods have the advantages of wide analysis range and high precision, but they also have poor sample representativeness. , cumbersome operation, high inspection cost and other shortcomings. Contents of the invention [0003] The purpose of the present invention is to provide a metallographic analysis method for gold detection in order to overcome the deficiencies of the prior art. [0004] The present invention is achi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/25G01N21/88
Inventor 杨佩王浩杰陈晓泉伏荣进杨鹔龚诚王鑫磊
Owner NANJING INST OF PROD QUALITY INSPECTION
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