Built in self-testing and repair device and method

Abstract

A memory device with background built-in self-testing (BBIST) includes a plurality of memory blocks; a memory buffer to offload data from one of the plurality of memory blocks temporarily; and a memory block stress controller to control a stress test applied to the one of the memory blocks when the data is temporarily offloaded on the memory buffer. The stress test tests for errors in the one of the plurality of the memory blocks.

Description

[0001] Related Application Cross Reference [0002] This application claims co-pending U.S. Provisional Patent No. 61 / 582,365, entitled "Hidden Memory Repair," filed January 1, 2012 by Bendik Kleveland Priority and Benefit of Application (Attorney Docket No. MP-1213-PR1), which is also incorporated herein by reference in its entirety. [0003] This application also claims the title "MEMORY DEVICE WITH BACKGROUND BUILT-IN SELF-TESTING" filed January 2, 2013 by Bendick Cleveland. AND BACKGROUND BUILT-IN SELF-REPAIR)," co-pending U.S. Nonprovisional Patent Application No. 13 / 732,783 (Attorney Docket No. MP-1213), which is also incorporated by reference in its entirety way incorporated into this article. Background technique [0004] Referring to prior art FIG. 1 , there is shown a functional block diagram of a prior art memory that uses scrubbing to correct detected errors. Scrubbing is a method of using extra bits of information (i.e., redundant information) added to the dat...

AI Technical Summary

Problems solved by technology

Otherwise, it may be due to the unpredictability of its performance, the perceived future degradation threat to the required system reliability and runtime, or simply due to the lack of redundant memory resources (RMR) (due to previous consumption of RMR or insufficient RMR adequate capacity) and is judged unable to work

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