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Method and device for measuring brain longitudinal relaxation value

A technology of longitudinal relaxation and measurement method, which is applied in diagnostic recording/measurement, medical science, diagnosis, etc. It can solve the problems of easy motion artifacts, patient discomfort, time-consuming and other problems in image acquisition, so as to reduce motion artifacts and not easily Patient discomfort, effect of shortening collection time

Active Publication Date: 2019-02-12
SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI
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  • Abstract
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Problems solved by technology

However, its disadvantages are also obvious, that is, it is very time-consuming
For example, to acquire a T1 image of 256×256, assuming that the repetition time (TR) is 10 seconds, it takes 43 minutes to complete the entire scan, which makes the T1 image acquisition process consume a lot of time, which can easily cause discomfort to the patient and cause motion artifacts in the acquired image. film

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  • Method and device for measuring brain longitudinal relaxation value
  • Method and device for measuring brain longitudinal relaxation value
  • Method and device for measuring brain longitudinal relaxation value

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Embodiment Construction

[0036] In order to make the object, technical solution and advantages of the present invention clearer, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0037] like figure 1 As shown, in one embodiment, a method for measuring the longitudinal relaxation value of the brain is provided, the method comprising the steps of:

[0038] Step 101 , applying IR radio frequency pulses to a preset number of layers, so that the magnetization vectors in the preset number of layers are flipped by 180 degrees.

[0039] In this embodiment, the layer refers to the imaging layer formed by magnetic resonance scanning of the brain. An IR (Inversion recover) radio frequency pulse is applied by the transmitting coil, and at the same time, the layer selection gradient i...

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Abstract

The invention provides a brain longitudinal relaxation value measuring method and an apparatus. The method comprises the following steps of applying an IR radio frequency pulse to a preset numbers of layers to enable a magnetized vector in the preset numbers of layers to turn over in 180-degree, and collecting a T1 image for a magnetized vector restoring curve in the preset numbers of layers via a staggered collection mode. The layer is an image layer formed via brain magnetic resonance scan; and parallel imaging and part Fourier transform accelerating technologies are employed during the T1 image collection by the staggered collection mode. T1 image collection time can be greatly shortened by the use of the above method and apparatus.

Description

technical field [0001] The invention relates to the technical field of magnetic resonance imaging, in particular to a method and device for measuring the longitudinal relaxation value of the brain. Background technique [0002] The T1 value is the relaxation time constant of the longitudinal magnetization vector in the process of magnetic resonance imaging (MRI), which is an inherent property of biological tissues. Compared with traditional T1-weighted images, the quantitative estimation of brain T1 values ​​avoids differences caused by scanning locations, sequence parameter settings, and subjective factors. Provide effective basis for early detection, clinical diagnosis and treatment [0003] The traditional quantitative estimation method of T1 value generally adopts the inversion recovery spin echo (IR-SE) method, which has high precision and accuracy, and is usually used as the gold standard. However, its disadvantage is also obvious, that is, it is very time-consuming....

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): A61B5/055
CPCA61B5/055
Inventor 刘新吴垠朱燕杰钟耀祖江克郑海荣
Owner SHENZHEN INST OF ADVANCED TECH CHINESE ACAD OF SCI
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