A single event effect testing method and system for an analog-to-digital converter

Abstract

The invention relates to an analog-digital converter single particle effect test method and a system thereof. According to an ADC device function, four parameters, which are used for evaluating an ADC device anti-single particle performance, and are respectively a noise error cross section, an offset error cross section, a single particle function interruption cross section, and a single particle locked cross section, can be acquired. By considering a conservative property required by a device anti-radiation performance and requirements of practical application, the feasible testing method is provided for testing the anti-single particle performance of the ADC device. A testing board is mainly constituted by a main control circuit, a waveform generator, a DUT reference source, a DUT testing circuit, a function monitoring circuit, a host computer interface circuit, and an input output interface circuit. The number of the occurrence of the noise errors and the offset errors of the tested ADC device can be calculated, and the concrete code value information can be returned during the occurrence of the effect. The detailed effect data information can be used to provide the data support for the analysis of the ADC device single particle effect sensitive physical position and the reinforcement of the anti-single particle performance.

Description

technical field [0001] The invention relates to a test system and method for an analog-to-digital converter (ADC), in particular to a test system and method for a single event effect of an ADC device. Background technique [0002] In recent years, with the development of my country's military industry and aerospace industry, analog circuit devices represented by analog to digital converters (ADC) are also used more and more in weapons and space satellites. What is seriously inconsistent with this is that there is no mature test method for the radiation resistance performance of ADC devices in my country, especially the single event effect research of ADC devices is still in its infancy. Therefore, in-depth research on the single event effect mechanism of ADC devices, the establishment of single event effect test systems and methods, and the acquisition of single event effect cross-sections of ADC devices provide technical support for accurate evaluation of ADC device anti-si...

AI Technical Summary

Problems solved by technology

In the ADC, the single event effect will not only form a single event transient disturbance in the analog circuit, but also form a single event reversal in the digital circuit. In addition, the ADC device is in the process of continuous data conversion during the irradiation experiment, and its internal digital circuit The value of the register or lock in the device is constantly changing, so that both effects will be reflected on the data output interface of the ADC device, and they are instantaneous, so that the single event effect test method of the ADC is better than that of a pure digital integrated circuit. It is more complicated, especially how to characterize the anti-single event performance of ADC devices, there is no unified understanding and method in China

Patent application number CN201210548033, titled "A Single Event Effect Detection Method for Folded Interpolation Analog-to-Digital Converter Devices", considers the difference between the output of the measured analog-to-digital converter and the expected value as a single event reversal effect, but the ADC device is in the In the conversion process, there is a conversion error itself, so this method cannot accurately distinguish the conversion error existing in the device itself and the single event effect

In addition, when the ADC device is applied, it is allowed to have a certain error range from the theoretical value. Therefore, in many cases, the conversion caused by the effect does not affect the use of the device. Therefore, it is difficult to use this method to evaluate the anti-single event performance of the ADC device to meet the requirements of actual use. Require

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