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Microscope Image Acquisition Method Based on Sequential Sectioning

A technique of microscopy, sectioning, used in the field of imaging

Active Publication Date: 2019-11-26
INST OF AUTOMATION CHINESE ACAD OF SCI
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The embodiment of the present invention provides a microscope image acquisition method based on serial slices to solve the technical problem of how to efficiently complete the automatic acquisition of images of sample regions of interest

Method used

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  • Microscope Image Acquisition Method Based on Sequential Sectioning
  • Microscope Image Acquisition Method Based on Sequential Sectioning
  • Microscope Image Acquisition Method Based on Sequential Sectioning

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Embodiment Construction

[0064] The present invention will be described in detail below with reference to the drawings and specific embodiments.

[0065] For the automatic acquisition of microscope images of serial slices, an embodiment of the present invention proposes a method of acquiring microscope images based on serial slices, such as figure 1 As shown, the method may include: step S100 to step S150. among them:

[0066] S100: Obtain a sequence slice sample and its navigation map.

[0067] Among them, the navigation map can be obtained by taking a complete shot with an optical camera, or by taking a partial image with a high-resolution microscope, and then stitching it into a complete navigation map.

[0068] S110: Use image processing and machine learning methods to identify and mark the sequence slice samples in the navigation map.

[0069] In this step, the coordinate point position of each sequence slice sample in the navigation map is recorded, so that the exact position of each sequence slice sampl...

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Abstract

The invention discloses a microscope image collection method based on serial slices. The method includes obtaining a sequence slice sample and its navigation map; using image processing and machine learning methods to identify and mark the sequence slice sample in the navigation map; placing the sequence slice sample in a microscope, and navigating any pixel in the navigation map Locate to the center of the field of view of the microscope; locate the serial sliced ​​samples in the low-resolution field of view, and bind the sample acquisition parameters; bind based on the sample acquisition parameters, record the center point of the high-resolution acquisition area and the center point after matching the sample template The relative positional relationship between them; combined with the sample acquisition parameters and relative positional relationship, the images of the sample points are continuously collected. Through this technical solution, the technical problem of how to efficiently complete the automatic acquisition of images of sample regions of interest is realized, and the automatic imaging of large-scale sequential samples under a microscope (electronic or optical) with an automatic control interface is realized.

Description

Technical field [0001] The embodiment of the present invention relates to the field of imaging technology, in particular to a method for acquiring microscope images based on sequence slices. Background technique [0002] Ultra-thin serial slice three-dimensional imaging technology refers to the technology of cutting biological tissue into ultra-thin serial sections or slices and imaging them one by one using an electron microscope; according to different segmentation techniques, it is mainly divided into serial section imaging and serial slice imaging. Types: (1) Sequential section imaging is a combination of sectioning and imaging in the sample cavity of the electron microscope. This type of method has close resolution in the horizontal and vertical directions, and is isotropic. The disadvantage is that the destructive sectioning method, once the data is found Defects cannot be repaired, which is not conducive to the development of large-scale reconstruction work; (2) Sequential...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G06K9/00G06K9/46G06K9/62
CPCG06V20/695G06V10/443G06F18/23213G06F18/214
Inventor 李国庆马宏图韩华魏利新
Owner INST OF AUTOMATION CHINESE ACAD OF SCI
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