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A multi-mode substrate integrated waveguide resonator for measuring the electrical characteristics of a pcb substrate and its measurement method

A technology that integrates waveguides and resonators on a substrate, which is applied in the measurement of electrical variables, resonators, waveguide-type devices, etc., can solve problems such as low efficiency of structural testing, and achieve the effects of high testing efficiency, high Q value and high testing accuracy.

Active Publication Date: 2020-02-18
UNIV OF ELECTRONICS SCI & TECH OF CHINA
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Problems solved by technology

[0007] The purpose of the present invention is to solve the problem of low test efficiency of the existing reported structure under the premise of ensuring the broadband measurement of the substrate integrated waveguide resonator

Method used

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  • A multi-mode substrate integrated waveguide resonator for measuring the electrical characteristics of a pcb substrate and its measurement method
  • A multi-mode substrate integrated waveguide resonator for measuring the electrical characteristics of a pcb substrate and its measurement method
  • A multi-mode substrate integrated waveguide resonator for measuring the electrical characteristics of a pcb substrate and its measurement method

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Embodiment approach

[0022] Implementation method: such as figure 1 , figure 2 and image 3 As shown, a method for measuring PCB substrate based on multi-mode substrate integrated waveguide resonant cavity broadband is characterized in that the standard W-band metal feed waveguide 1, resonant cavity 2, and first metal copper clad layer 21 are sequentially stacked from top to bottom , a dielectric layer 22, a second metal copper-clad layer 23, a standard W-band metal feed waveguide 3; a rectangular slit 211 is etched on the edge of the first metal copper-clad layer 21 to form a feed coupling gap; the edge of the dielectric layer 22 runs through the metal The vias 221 together with the first metal copper clad layer 21 and the second metal copper clad layer 23 form a substrate integrated waveguide waveguide resonant cavity; a rectangular slit 231 is etched on the edge of the second metal copper clad layer 23 .

[0023] Working principle: the present invention adopts a single substrate integrated w...

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Abstract

The invention discloses a multi-mode substrate integrated waveguide resonator for measuring the electrical properties of a PCB substrate and a measurement method thereof, which belongs to the technical field of material dielectric property testing, and in particular relates to a method for measuring electrical properties of materials based on millimeter-wave multi-mode resonant cavities. The signal input to the feed waveguide makes the working mode of the substrate integrated waveguide resonator continuously excited through the coupling gap, and the working mode of the substrate integrated waveguide resonator is changed by changing the frequency of the input signal. The electrical characteristics of the substrate in the chip integrated waveguide resonator; realize the measurement of the electrical performance parameters of the substrate with small and approximately equal frequency spacing.

Description

technical field [0001] The invention belongs to the technical field of material dielectric characteristic testing, in particular to a method for measuring electrical characteristic of a material based on a millimeter-wave multimode resonant cavity. Background technique [0002] PCB substrates are widely used in wireless communication systems, especially in the millimeter wave frequency band, and it is becoming more and more important to accurately measure the electrical properties of the substrate. At present, the measurement methods are mainly divided into two types: transmission method / reflection method and resonance method, among which the resonance method is especially suitable for accurate measurement of low-loss media. Compared with the traditional microstrip ring and metal waveguide cavity resonance method, the measurement method based on the substrate integrated waveguide cavity has the characteristics of low loss and low profile. [0003] For example, the literatur...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01P7/06G01R27/26
CPCG01R27/2617G01R27/2694H01P7/065
Inventor 程钰间王洪斌吴亚飞周明明樊勇张波林先其张永鸿赵明华
Owner UNIV OF ELECTRONICS SCI & TECH OF CHINA
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