Method for optimizing SAR antenna directional diagram test
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- SHANGHAI SATELLITE ENG INST
- Publication Date
- 2017-11-07
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Abstract
Description
technical field
[0001] The invention relates to an optimization method, in particular to a method for optimizing the SAR antenna pattern test. Background technique
[0002] With the rapid development of Synthetic Aperture Radar (SAR), my country's first high-resolution X-band active planar phased array SAR satellite came into being. The satellite has right-view and left-view imaging capabilities, and there are four working modes in each side-view state. The antenna beams of the spotlight mode and the scanning mode not only need to change the angle of view in the range direction, but also need to scan in the azimuth direction. Due to the coupling of the range direction and the azimuth direction, the wave number in these two modes is equal to the multiplication of the wave number in the range direction. The number of wave positions in the azimuth direction increases significantly; in order to make the target located in the center of the imaging zone as much as possible, the o...