Energy parameter adjustment system and method in chip error injection test

Abstract

The invention discloses an energy parameter adjustment system and method in a chip error injection test, and the method comprises the steps: collecting a state signal, electromagnetic signal and power consumption signal of a to-be-tested chip in an error injection attack test process; judging and analyzing whether the injected energy is reasonable or not according to the state signal, the electromagnetic signal and the power consumption signal; dynamically adjusting the energy parameters of an interference source according to an analysis result, and controlling the output energy of the interference source according to the adjusted energy parameters; generating more reasonable energy parameter information in advance through the former test and adjustment process, carrying out the testing operation later according to the energy parameter information, and updating and optimizing the pre-generated energy parameter information in the test process. The system and method can achieve the automatic adjustment and optimization of parameters, greatly improve the testing efficiency, and guarantee the accuracy and effectiveness of a testing result.

Description

technical field [0001] The invention belongs to the technical field of chip information security, and relates to an energy parameter adjustment system and method in chip error injection testing. Background technique [0002] The chip stores key information such as user personal information and account information. Once it is attacked and used by criminals, the information in the chip will be leaked, such as personal information leakage, user name and password leakage, property loss, etc., causing irreparable damage to users. Loss. [0003] With the rapid development of electronic technology, chips have been widely used in bank transaction management, medical insurance, public transportation, mobile communications and other fields, which provide great convenience for people's life. At the same time, the information security of chips It has also become the focus of people's attention. [0004] The existing attack methods against chips are not limited to the encryption algori...

AI Technical Summary

Problems solved by technology

[0005] At present, the problem encountered in the testing of chip fault injection attacks is that due to the different chip technology and circuit structure, the sensitivity of different chips or different modules of the same chip to energy sources (laser, electromagnetic, glitch, etc.) Different, for example, when the laser energy is too large, there may be a latch-up phenomenon in the circuit; The results are all obtained by the experience of the test engineer, and the accuracy and comprehensiveness of the test results cannot be guaranteed. Using a simple exhaustive method to try all energy parameters will not only result in excessive test costs, but also inefficiency

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